
Overview
- Provides a comprehensive analysis of the practical methodologies and techniques used for the measurements of optical properties and spectral characteristics of varieties of objects, materials, and biological, medical and environmental species
- Guides the reader through the advantages and disadvantages of the growing number of applied spectroscopic, radiometric and photometric techniques
- Revised throughout, including new material on Raman, Brillouin and FTIR spectroscopy techniques for biomedical applications
Part of the book series: Springer Series in Optical Sciences (SSOS, volume 209)
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About this book
The revised 2nd edition of this practical book provides an expanded treatment and comparison of techniques used in advanced optical measurements, guiding its reader from fundamental radiometric and photometric concepts to the state-of-the-art in highly sensitive measurements of optical losses and in spectroscopic detection using coherent laser light and spontaneous radiation. The book describes and compares a broad array of high-sensitivity methods and techniques – from interferometric and/or calorimetric, acousto-optic and resonator or polarization to wavelength- and frequency-modulation, phase-shift and decay time studies, and direct-loss measurements for free-space, fiber- or waveguide-based systems and devices.
Updated throughout, the new edition describes novel trends in spectral interferometry, frequency-comb and laser-excitation spectroscopy, reflected in the developments of Raman, Brillouin and FTIR (Fourier Transform Infra-Red) techniques for biomedical research, biotech sensing and detection. It also covers broad practical implementations of time- and frequency-domain terahertz spectroscopy measurements.
This book reviews the physical concepts of radiation transfer, providing a quantitative foundation for the means of measurements of optical losses, which affect propagation and distribution of light waves in various media and in diverse optical systems and components. It focuses on the application of optical methods and procedures for the evaluation of transparent, reflecting, scattering, absorbing, and aggregated objects, and for determining the power and energy parameters of radiation and color properties of light. This updated new edition will serve as an up-to-date reference source and practical guide for those using photometric and radiometric techniques.
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Keywords
- Color Photometry
- Laser Spectroscopy
- Measurements of Optical Losses
- Noise & Diffraction Corrections
- Spectrophotometric Analysis
- Applied photometric techniques
- Applied radiometric techniques
- photometric measurements
- radiometric measurements
- Practical optical measurement techniques
- Frequency-comb spectroscopy
- Laser-excitation spectroscopy
- Fourier-transform Infrared spectroscopy
- Time-and frequency-domain terahertz spectroscopy
Table of contents (13 chapters)
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Applied Photometry and Radiometry
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Measurements of Optical Losses
Authors and Affiliations
About the author
Michael A Bukshtab received M.S. and Ph.D. degrees in “Optical Design and Spectroscopy” and in “Physical Optics” from The State University of Information Technologies, Mechanics & Optics and from The Vavilov’ State Optical Institute, having the post-doctoral tenure analysing high-purity silica glasses and specialty fibres in The Institute of Silicate Chemistry, Academy of Sciences all in St. Petersburg (Leningrad), Russia. Michael's M.S. thesis received the Best Diploma Award among all Leningrad's technical universities and was published in “Measurement Techniques” in 1978. Michael’s monograph “The Low Loss Measurement Techniques”, 165 pages, was published in 1988 by Energoatomizdat, Moscow-Leningrad. The second book by M.A. Bukshtab, A. S. Doynikov, and V. N. Koromislichenko, “Photometry and Radiometry for Engineers” (editors M. A. Bukshtab and A. A. Wolkenstein) was left unpublished by Leningrad's Polytechnika. During the Perestroika movement Michael was elected by employees the Board Chairman for the Leningrad Institute of Telecommunications, where he served from 1989 until has immigrating to the United States in 1991. In the USA Michael worked on design, development, fabrication of optical systems and components for various companies, such as Sandoz, Corning, Pirelli, Kodak, CIENA, Lucent, GE Advanced Materials, and ASML. Michael experiences via MBOptical consulting includes designing complex systems and components and investigating various optical properties, while studying colour, polarization-dependent, backreflection, backscattering and other phenomena, developing wavelength-switching or cross-connect systems and OADM networks, working on optical routers and backplanes, investigating lithography and Fourier Transform Infrared Spectroscopy (FTIR) systems, researching augment reality displays, interferometric and diffraction-based positioning sensors, EDFA fibre-laser lidars, improving Brillouin-scattering confocal microscopy and interferometryfor studying eye corneal elasticity, enhancing optical diagnostics tools for reservoir Raman spectroscopy. Michael has authored and co-authored more than 35 Patents and Invention Certificates and participated in more than 80 Scientific Publications and Conference Presentations. Since January 2018 Michael is the Senior Research Fellow at the Optoelectronics Centre, University of Southampton, United Kingdom, working on enhancing optical metrology for photonic-crystal fibres.
Bibliographic Information
Book Title: Photometry, Radiometry, and Measurements of Optical Losses
Authors: Michael Bukshtab
Series Title: Springer Series in Optical Sciences
DOI: https://doi.org/10.1007/978-981-10-7745-6
Publisher: Springer Singapore
eBook Packages: Physics and Astronomy, Physics and Astronomy (R0)
Copyright Information: Springer Nature Singapore Pte Ltd. 2019
Hardcover ISBN: 978-981-10-7744-9Published: 06 March 2019
eBook ISBN: 978-981-10-7745-6Published: 25 February 2019
Series ISSN: 0342-4111
Series E-ISSN: 1556-1534
Edition Number: 2
Number of Pages: XX, 797
Number of Illustrations: 9 b/w illustrations, 484 illustrations in colour
Topics: Optics, Lasers, Photonics, Optical Devices, Spectroscopy/Spectrometry, Microwaves, RF and Optical Engineering, Measurement Science and Instrumentation, Spectroscopy and Microscopy, Classical Electrodynamics