Microwave De-embedding

From Theory to Applications
Erscheinungsjahr 2013
ISBN: 978-0-12-401700-9
Verlag: William Andrew Publishing

Buch, Englisch, 480 Seiten, Format (B × H): 191 mm x 235 mm, Gewicht: 1040 g

This groundbreaking book is the first to give an introduction to microwave de-embedding, showing how it is the cornerstone for waveform engineering. The authors of each chapter clearly explain the theoretical concepts, providing a foundation that supports linear and non-linear measurements, modelling and circuit design. Recent developments and future trends in the field are covered throughout, including successful strategies for low-noise and power amplifier design. This book is a must-have for those wishing to understand the full potential of the microwave de-embedding concept to achieve successful results in the areas of measurements, modelling, and design at high frequencies.

With this book you will learn:

- The theoretical background of high-frequency de-embedding for measurements, modelling, and design

- Details on applying the de-embedding concept to the transistor's linear, non-linear, and noise behaviour

- The impact of de-embedding on low-noise and power amplifier design

- The recent advances and future trends in the field of high-frequency de-embedding

Zielgruppe

<p>Microwave circuit designers, R&D engineers, researchers and industrial professionals</p>

Autoren/Hrsg.

Crupi, Giovanni

Schreurs, Dominique

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikrowellentechnik

Inhaltsverzeichnis

Foreword by G. Ghione Foreword by S. Maas About the Editors Authors Biographies 1. A Clear-Cut Introduction to the De-embedding Concept: Less is More by G. Crupi, D. Schreurs and A. Caddemi 2. Millimeter-Wave Characterization of Silicon Devices under Small-Signal Regime: Instruments and Measurement Methodologies by G. Dambrine 3. Characterization and Modeling of High-Frequency Active Devices Oriented to High-Sensitivity Subsystems Design by E. Limiti, W. Ciccognani, and S. Colangeli 4. High-Frequency and Microwave Electromagnetic Analysis Calibration and De-embedding by J. Rautio 5. Large-Signal Time-Domain Waveform-Based Transistor Modeling by I. Angelov, G. Avolio, and D. Schreurs 6. Measuring and Characterizing Nonlinear Radio-Frequency Systems by W. Van Moer, L. Lauwers, and K. Barbe 7. Behavioral Models for Microwave Circuit Design by J. Pedro, and T. Cunha 8. Electromagnetic-Analysis-Based Transistor De-embedding and Related Radio-Frequency Ampli?er Design by M. Yarlequé, D. Scheurs, B. Nauwelaers, D. Resca, and G. Vannini 9. Nonlinear Embedding and De-embedding: Theory and Applications by A. Raffo, V. Vadalà, and G. Vannini

Über Autor(innen)

Crupi, Giovanni
Giovanni Crupi is a tenure track assistant professor at the University of Messina, Italy, where he teaches microwave electronics, laboratory of wireless technologies, bioengineering, and optoelectronics. Since 2005, he has been a repeat visiting scientist with KU Leuven and IMEC, Leuven, Belgium. Giovanni's main research interests include small and large signal modeling of advanced microwave devices. He is a member of the Technical Programme Committee of the IEEE INMMiC and TELSIKS conferences and serves as an associate editor of International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. Giovanni is the chair of the IEEE Microwave Theory and Techniques Society (MTT-S) Fellowship program.

Schreurs, Dominique
Dominique Schreurs is a full professor at KU Leuven, Leuven, Belgium. Previously, she has been a visiting scientist at Agilent Technologies (USA), Eidgenössische Technische Hochschule Zürich (Switzerland), and the National Institute of Standards and Technology (USA). Dominique's main research interests concern linear and nonlinear characterization and modeling of microwave devices and circuits, as well as linear and nonlinear hybrid and integrated circuit design for telecommunications and biomedical applications. She is the technical chair of ARFTG and serves as the editor of the IEEE Transactions on Microwave Theory and Techniques.