Aberration Theory in Electron and Ion Optics

Erscheinungsjahr 2023
ISBN: 978-0-443-19320-0
Verlag: Elsevier Science & Technology

Buch, Englisch, Format (B × H): 152 mm x 229 mm, Gewicht: 730 g

Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Halb- und Supraleitertechnologie
• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Naturwissenschaften Physik Elektromagnetismus Optik
• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik

Inhaltsverzeichnis

- The electron optical imaging system and its aberrations

Jiye Ximen

- The electromagnetic deflection system and its aberrations

Jiye Ximen

- The electromagnetic multipole system and its aberrations

Jiye Ximen

- The ion optical system and its aberrations

Jiye Ximen

- Computer aided design of electron and ion optical systems

Jiye Ximen

Afterword: Life and works of Jiye Ximen

Peter Hawkes

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.