Defects and Diffusion in Semicondutors, 2009

Erscheinungsjahr 2009
ISBN: 978-3-908451-63-1
Verlag: Trans Tech Publications

Buch, Englisch, 184 Seiten, Format (B × H): 170 mm x 240 mm, Gewicht: 600 g

This eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes – in line with the new editorial policy of including original papers on all of the major material groups: “Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites” (H.Abdullah and S.A.Halim), “Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon” (M.N.Mungole, M.Surender, R.Balasubramaniam and S.Bhargava), “Quantitative Concept for Morphological Stability Analysis of Solid/Liquid Interface in Rapid Solidification of Dilute Binary Alloys” (M.Draissia), “Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X = Cl, Br) (Z.H.Zhang, S.Y.Wu, X.F.Wang and Y.X.Hu).

Autoren/Hrsg.

Fisher, David

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde

Inhaltsverzeichnis

Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites
Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon
Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys
Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br)