Advances in Imaging and Electron Physics

Erscheinungsjahr 2010
ISBN: 978-0-12-381312-1
Verlag: William Andrew Publishing

Buch, Englisch, 392 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 660 g

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Physik Allgemein Theoretische Physik, Mathematische Physik, Computerphysik
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Mathematik | Informatik Mathematik Numerik und Wissenschaftliches Rechnen Angewandte Mathematik, Mathematische Modelle

Inhaltsverzeichnis

- Magnetolithography - from the Bottom-Up Route to High Throughput - Amos Bardea and Ron Naaman

- The Optics of the Spatial Coherence Wavelets - Román Castañeda

- Common Diffraction Integral Calculation Based on Fast Fourier Transform Algorithm - LI Junchang, WU Yanmei and LI Yan

- A generalized approach to describe the interference contrast and the phase contrast method - Marcel Teschke and Stefan Sinzinger

- Nonlinear partial differential equations for noise problems - Booyong Choi
- Harmuth Corrigenda - Henning Harmuth

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Edited by Peter W. Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France