Advances in Imaging and Electron Physics

Erscheinungsjahr 2012
ISBN: 978-0-12-394297-5
Verlag: William Andrew Publishing

Buch, Englisch, 440 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 790 g

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung

Inhaltsverzeichnis

- Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence

G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler

- Thermal Imaging in Medicine

Lila Iznita Izhar and Maria Petrou

- Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review

Jean-Michel Tualle

- Imaging Mass Spectrometry - Sample Preparation, Instrumentation and Applications

Kamlesh Shrivas and Mitsutoshi Setou

- Transformation Optics

Robert T. Thompson and Steven A. Cummer

- TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications

Tobias Klein, Egbert Buhr and Carl Georg Frase

- Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics

M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.