Buch, Englisch, 696 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 980 g
Part A
Buch, Englisch, 696 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 980 g
ISBN: 978-0-12-394422-1
Verlag: William Andrew Publishing
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Zielgruppe
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Fachgebiete
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
- Naturwissenschaften Physik Angewandte Physik
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Elektronische Baugruppen, Elektronische Materialien
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik
- Naturwissenschaften Physik Elektromagnetismus Optik
Weitere Infos & Material
- Introduction to Neutron and X-ray Optics
Jay Theodore Cremer
- Compound Refractive Lenses and Prisms
Jay Theodore Cremer
- Geometric Neutron and X-ray Optics - Aberrations
Jay Theodore Cremer
- X-ray Optics
Jay Theodore Cremer
- Neutron Optics
Jay Theodore Cremer
- X-ray and Neutron Optics
Jay Theodore Cremer
