Advances in Imaging and Electron Physics

Part A
Erscheinungsjahr 2012
ISBN: 978-0-12-394422-1
Verlag: William Andrew Publishing

Buch, Englisch, 696 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 980 g

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Cremer Jr., Jay Theodore

Fachgebiete

• Naturwissenschaften Physik Angewandte Physik
• Naturwissenschaften Physik Elektromagnetismus Optik
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Elektronische Baugruppen, Elektronische Materialien

Inhaltsverzeichnis

- Introduction to Neutron and X-ray Optics

Jay Theodore Cremer

- Compound Refractive Lenses and Prisms

Jay Theodore Cremer

- Geometric Neutron and X-ray Optics - Aberrations

Jay Theodore Cremer

- X-ray Optics

Jay Theodore Cremer

- Neutron Optics

Jay Theodore Cremer

- X-ray and Neutron Optics

Jay Theodore Cremer