Advances in Imaging and Electron Physics

Erscheinungsjahr 2015
ISBN: 978-0-12-802254-2
Verlag: William Andrew Publishing

Buch, Englisch, 232 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 520 g

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung

Inhaltsverzeichnis

- Pattern Generators for Reflective Electron-Beam Lithography (REBL)Allen M. Carroll
- Recent Developments in Time-of-Flight Mass SpectrometryFrank Gunzer and Jürgen Grotemeyer
- A Special Voice Transform, Analytic Wavelets, and Zernike FunctionsMargit Pap
- The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and ImagingColin Sheppard

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.