Advances in Imaging and Electron Physics

Erscheinungsjahr 2020
ISBN: 978-0-12-820999-8
Verlag: William Andrew Publishing

Buch, Englisch, 328 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 610 g

Computer Techniques for Image Processing in Electron Microscopy, Volume 214 in the Advances in Imaging and Electron Physics series, presents the latest advances in the field, with this new volume covering Image Formation Theory, The Discrete Fourier Transform, Analytic Images, The Image and Diffraction Plane Problem: Uniqueness, The Image and Diffraction Plane Problem: Numerical Methods, The Image and Diffraction Plane Problem: Computational Trials, Alternative Data for the Phase Determination, The Hardware of Digital Image Handling, Basic Software or Digital Image Handling, Improc, and much more.

Zielgruppe

<p>Physicists, astronomers and engineers studying inverse imaging problems, digital image processing, aberration correction, ptychography and electron crystallography</p>

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Naturwissenschaften Physik Elektromagnetismus Optik
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

1. Image formation theory

W. Owen Saxton

2. The discrete Fourier transform

W. Owen Saxton

3. Analytic images

W. Owen Saxton

4. The image and diffraction plane problem: uniqueness

W. Owen Saxton

5. The image and diffraction plane problem: numerical methods

W. Owen Saxton

6. The image and diffraction plane problem: computational trials

W. Owen Saxton

7. Alternative data for the phase determination

W. Owen Saxton

8. The hardware of digital image handling

W. Owen Saxton

9. Basic software for digital image handling

W. Owen Saxton

10. Improc

W. Owen Saxton

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.