Advances in Imaging and Electron Physics

Erscheinungsjahr 2021
ISBN: 978-0-12-824612-2
Verlag: William Andrew Publishing

Buch, Englisch, 340 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 700 g

Advances in Imaging and Electron Physics, Volume 219, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Zielgruppe

<p>Undergraduates, graduates, academics and researchers in the field of Advances in Imaging and Electron Physics</p>

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

Preface Martin Hÿtch and Peter W. Hawkes 1. Introduction to strain characterization method in transmission electron microscopy Alexandre Pofelski? 2. Moiré sampling in scanning transmission electron microscopy Alexandre Pofelski? 3. Scanning transmission electron microscopy moiré sampling geometrical phase analysis (STEM moiré GPA) Alexandre Pofelski? 4. Performance of scanning transmission electron microscopy moiré sampling geometrical phase analysis Alexandre Pofelski? 5. Applications of scanning transmission electron microscopy moiré sampling geometrical phase analysis Alexandre Pofelski? 6. Quasi-analytical modelling of charged particle ensembles in neutral gas flow and electric fields Mikhail Monastyrskiy, Roman Ablizen, Anatoly Neishtadt, Alexander Makarov, and Mikhail 7. Superconducting electron lenses David Hardy 8. Lorentz microscopy or electron phase microscopy of magnetic objects Richard Harry Wade

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.