Advances in Imaging and Electron Physics

Erscheinungsjahr 2021
ISBN: 978-0-323-91505-2
Verlag: William Andrew Publishing

Buch, Englisch, 276 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 590 g

Advances in Imaging and Electron Physics, Volume 218 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics - with review of the physics, and more.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Signalverarbeitung
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

Preface Martin Hÿtch and Peter W. Hawkes 1. Phase retrieval methods applied to coherent imaging Tatiana Latychevskaia 2. X-ray phase-contrast imaging: a broad overview of some fundamentals David M. Paganin and Daniele Pelliccia 3. Graphyne and borophene as nanoscopic materials for electronics - with review of the physics C. M. Krowne 4. The ESAB effect and the physical meaning of the vector potential R. Carles, O. Pujol, and J.-Ph. Perez 5. Electron image plane off-axis holography of atomic structures Hannes Lichte

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.