Economics of Electronic Design, Manufacture and Test

Softcover Nachdruck of the original 1. Auflage 1994
ISBN: 978-1-4419-5142-7
Verlag: Springer US

Buch, Englisch, 192 Seiten, Paperback, Format (B × H): 210 mm x 279 mm, Gewicht: 492 g

The general understanding of is that it should lead to a manufacturable product. Neither the design nor the process of manufacturing is perfect. As a result, the product will be faulty, will require and fixing. Where does enter this scenario?
Consider the cost of testing and fixing the product. If a manufactured product is grossly faulty, or too many of the products are faulty, the cost of testing and fixing will be high. Suppose we do not like that. We then ask what is the cause of the faulty product. There must be something wrong in the manufacturing process. We trace this cause and fix it. Suppose we fix all possible causes and have no defective products. We would have eliminated the need for testing.
Unfortunately, things are not so perfect. There is a cost involved with finding and eliminating the causes of faults. We thus have two costs: the cost of testing and fixing (we will call it cost-1), and the cost of finding and eliminating causes of faults (call it cost-2). Both costs, in some way, are included in the overall cost of the product. If we try to eliminate cost-1, cost-2 goes up, and vice versa. An economic system of production will minimize the overall cost of the product.
is a collection of research contributions derived from the Second Workshop on Economics of Design, Manufacture and Test, written for inclusion in this book.

Zielgruppe

Research

Autoren/Hrsg.

Ambler, T.

Abadir, M.

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Elektronische Baugruppen, Elektronische Materialien
• Wirtschaftswissenschaften Wirtschaftssektoren & Branchen Fertigungsindustrie Spitzentechnologiesektor
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise

Inhaltsverzeichnis

A Tale of Two Designs: the Cheapest and the Most Economic.- Test Strategy Planning Using Economic Analysis.- Economic Modeling of Board Test Strategies.- Economics of “Design for Test” to Remain Competitive in The 90s.- The Economics of Scan-Path Design for Testability.- High Level Test Economics Advisor (Hi-TEA).- Multichip Systems Tradeoff Analysis Tool.- Trade-Off Analysis on Cost and Manufacturing Technology of an Electronic Product: Case Study.- Cost Based Surface Mount PCB Design Evaluation.- Sensitivity Analysis in Economics Based Test Strategy Planning.- Improving Quality: Yield Versus Test Coverage.- Boundary Scan in Board Manufacturing.- Comparing Quality Assurance Methods and the Resulting Design Strategies: Experiences from Complex Designs.- Trade-Offs in Scan Path and BIST Implementations for RAMs.- Techniques for Estimating Test Length Under Random Test.- Fuzzy Optimization Models for Analog Test Decisions.- Self-Test of Sequential Circuits with Deterministic Test Pattern Sequences.