Atomic Force Microscopy-Based Electrical Characterization of Materials

1. Auflage 2021
ISBN: 978-1-4398-8299-3
Verlag: CRC PR INC

Buch, Englisch, 288 Seiten, Format (B × H): 156 mm x 234 mm

This timely book introduces the fundamental measurement concepts of the rapidly evolving atomic force microscopy (AFM) techniques for electrical characterization (EFM). It describes experimental approaches and setups, as well as challenges to overcome, and it also provides a wide range of real-world examples illustrating the method. This comprehensive guide for EFM techniques and their applications is an excellent reference for those working on microscopy in different fields, making the methods more accessible to a wider audience and enabling readers to explore the numerous possibilities of electrical techniques as research tools.

Zielgruppe

Academic and industrial researchers including materials scientists, electrical engineers, chemists, nanotechnologists, and physicists; junior scientists trained in other modes of AFM operation but not on electrical techniques; and students (undergraduate, graduate, postgraduate) using AFM in their research and coursework

Autoren/Hrsg.

Avila, Alba

Fachgebiete

• Naturwissenschaften Chemie Chemie Allgemein
• Naturwissenschaften Chemie Analytische Chemie Massenspektrometrie, Spektroskopie, Spektrochemie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

EFM techniques classification. Conventional and Novel Applications. Perspectives and Challenges. References.

Über Autor(innen)

Alba Avila, Associate Professor, University of Los Andes, Bogota, Colombia