Buch, Englisch, 630 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 9708 g
Reihe: NanoScience and Technology
Buch, Englisch, 630 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 9708 g
Reihe: NanoScience and Technology
ISBN: 978-3-662-50725-4
Verlag: Springer
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
- Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
- Technische Wissenschaften Technik Allgemein Nanotechnologie
- Naturwissenschaften Physik Thermodynamik Oberflächen- und Grenzflächenphysik, Dünne Schichten
Weitere Infos & Material
Part 1: Scanning probe microscopy techniques- Spectroscopic techniques in SPM- High speed AFM imaging.- New developments in imaging of biological samples.- New developments in AFM.- SNOM.- Part 2: Nanocharacterization.- Antibodies for protein recognition.- In-situ imaging of living cells.- In-situ crystallization of wax materials.- Part 3: Biomimetics and industrial applications.- Electrowetting and switchable hydrophobicity.- Renewable energy applications.- AFMs in hard disk industry.