Cahn / Lifshitz Concise Encyclopedia of Materials Characterization

1. Auflage 2016
ISBN: 978-1-4832-8751-5
Verlag: Elsevier Science & Techn.
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 670 Seiten, Web PDF

Reihe: Advances in Materials Sciences and Engineering

To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this.Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general.The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques.This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.

Autoren/Hrsg.

Cahn, R. W.

Lifshitz, E. M.

Inhaltsverzeichnis

1;Front Cover;1
2;Concise Encyclopedia of Materials Characterization;4
3;Copyright Page;5
4;Table of Contents;6
5;Honorary Editorial Advisory Board;7
6;Foreword;10
7;Executive Editor's Preface;12
8;Editors' Preface;14
9;Guide to Use of the Encyclopedia;16
10;Alphabetical List of Articles;18
11;An Introduction to Investigation and Characterization of Materials;20
12;CHAPTER A;30
12.1;Acoustic Emission;30
12.2;Acoustic Microscopy;33
12.3;Adhesives: Tests for Mechanical Properties;38
12.4;Art Forgeries: Scientific Detection;45
12.5;Atomic Force Microscopy;52
12.6;Auger Electron Spectroscopy;57
12.7;Auger Microscopy, Angular Distribution;63
13;CHAPTER C;72
13.1;Ceramic Materials: Cathodoluminescence Analysis;72
13.2;Ceramic Powders: Packing Characterization;76
13.3;Channelling-Enhanced Microanalysis;79
13.4;Chemical Analysis of Solid Surfaces;82
13.5;Composite Materials: Nondestructive Evaluation;87
13.6;Compton Scattering;94
13.7;Confocal Optical Microscopy;97
13.8;Corrosion and Oxidation Study Techniques;103
13.9;Corrosion: Test Methods;107
14;CHAPTER D;112
14.1;Depth Profiling;112
15;CHAPTER .;128
15.1;Elastomers: Spectroscopic Characterization;128
15.2;Elastomers: Tests for Mechanical Properties;130
15.3;Electron Diffraction;133
15.4;Electron Diffraction, Low-Energy;137
15.5;Electron Energy-Loss Spectrometry;141
15.6;Electron Microprobe Analysis;144
15.7;Electron Microscope Analysis of Defect Clusters, Voids and Bubbles;149
15.8;Electron Microscopy, Analytical;152
15.9;Electron Microscopy, High-Resolution;156
15.10;Electron Microscopy, High-Voltage;163
15.11;Electron Spectroscopy for Chemical Analysis;168
15.12;Electron Spin Resonance;173
15.13;Electron Tunnelling Spectroscopy;178
16;CHAPTER F;180
16.1;Field-Ion Microscopy: Atom-Probe Microanalysis;180
16.2;Field-Ion Microscopy: Observation of Radiation Effects;183
17;CHAPTER G;192
17.1;Gamma Radiography;192
17.2;Gamma-Ray Diffractometry;194
17.3;Gas and Liquid Chromatography;198
17.4;Gas Sensors, Solid-State;204
17.5;Grain Size: Nondestructive Evaluation;208
18;CHAPTER .;212
18.1;Hardness Characterization;212
18.2;Hydrogen as a Metallurgical Probe;216
19;CHAPTER I;222
19.1;Infrared Spectroscopy;222
19.2;Ion Backscattering Analysis;228
20;CHAPTER J;234
20.1;Junction Transient Spectroscopy;234
21;CHAPTER L;238
21.1;Laser Microprobe Mass Spectrometry;238
21.2;Laser Sampling Inductively Coupled Plasma Mass Spectrometry;244
21.3;Liquid Chromatography Mass Spectrometry;249
22;CHAPTER .;254
22.1;Magnetic Materials: Measurements;254
22.2;Mechanical Properties Microprobe;261
22.3;Microengineering of Materials: Characterization;267
22.4;Microstructural Evolution: Computer Simulation;275
22.5;Microtextural Analysis;284
22.6;Mössbauer Spectroscopy;288
23;CHAPTER .;296
23.1;Neutron Radiography;296
23.2;Nuclear Magnetic Resonance Spectroscopy;298
23.3;Nuclear Magnetic Resonance Spectroscopy of Solids;302
24;CHAPTER O;308
24.1;Optical Calorimetry;308
24.2;Optical Emission Spectroscopy;310
24.3;Optical Microscopy;315
24.4;Organic Mass Spectrometry;321
25;CHAPTER .;328
25.1;Paper and Paperboard: Destructive Mechanical Testing;328
25.2;Paper and Paperboard: Nondestructive Evaluation;331
25.3;Particle-Induced X-Ray Emission;338
25.4;Phase Diagrams and Phase Stability: Calculations;344
25.5;Pole Figures and Orientation Distribution Functions;351
25.6;Polymers: Electron Microscopy;358
25.7;Polymers: Light Microscopy;365
25.8;Polymers: Neutron Scattering;380
25.9;Polymers: Raman Spectroscopy;383
25.10;Polymers: Tests for Degradation and Stabilization;386
25.11;Polymers: Tests for Flammability;390
25.12;Polymers: Tests for Mechanical Properties;395
25.13;Polymers: Tests for Thermal Properties;400
25.14;Polymers: Thermal Analysis;404
25.15;Polymers: X-Ray Scattering;407
25.16;Porosity: Characterization and Investigation;410
25.17;Positron Annihilation Spectroscopy of Defects in Metals;419
25.18;Powder Characterization;421
25.19;Powder Mechanics;426
26;CHAPTER R;432
26.1;Raman Spectroscopy;432
26.2;Reflection Electron Microscopy;438
26.3;Residual Stresses: Measurement Using Neutron Diffraction;441
26.4;Residual Stresses: Nondestructive Evaluation;446
27;CHAPTER S;452
27.1;Scanning Electron Microscopy;452
27.2;Scanning Tunnelling Microscopy and Spectroscopy;456
27.3;Secondary-Ion Mass Spectrometry;467
27.4;Semiconducting Materials: Characterization by Etching;474
27.5;Semiconducting Materials: Electron Microscopy;481
27.6;Single-Crystal X-Ray Diffraction;486
27.7;Small-Angle Neutron Scattering in Metallurgy;491
27.8;Solid-State Nuclear Track Detectors: Applications;497
27.9;Solid State: Study Using Muon Beams;502
27.10;Spark-Source Mass Spectrography;509
27.11;Stress Distribution: Analysis Using Thermoelastic Effect;512
27.12;Superconducting Materials: Measurements;516
28;CHAPTER T;526
28.1;Texture: Nondestructive Characterization;526
28.2;Thermal Analysis: An Overview;527
28.3;Thermal Analysis: Recent Developments;535
28.4;Thermal Wave Imaging;544
28.5;Thermodynamic Activity: Measurement;549
28.6;Thermoluminescence;554
28.7;Thermophysical Measurements, Subsecond;558
28.8;Transmission Electron Microscopy: Convergent-Beam and Microdiffraction Techniques;569
29;CHAPTER V;576
29.1;Vibrothermography;576
30;CHAPTER W;580
30.1;Wood: Acoustic Emission and Acousto-UItrasonic Characteristics;580
31;CHAPTER X;584
31.1;X-Ray Absorption Spectroscopy: EXAFS and XANES Techniques;584
31.2;X-Ray and Neutron Diffraction Studies of Amorphous Solids;587
31.3;X-Ray and Neutron Diffuse Scattering of Radiation-Induced Defects;594
31.4;X-Ray Diffraction, Time-Resolved;596
31.5;X-Ray Fluorescence Spectrometry;599
31.6;X-Ray Microanalysis, Quantitative;606
31.7;X-Ray Powder Diffraction;610
32;LIST OF CONTRIBUTORS;618
33;SUBJECT INDEX;628