Sonstiges, Englisch, 988 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
Sonstiges, Englisch, 988 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
ISBN: 978-3-03859-827-5
Verlag: Trans Tech Publications
Autoren/Hrsg.
Weitere Infos & Material
Structure Determination from Very Small CrystalsAnalysis of Strain Fields by Means of Diffraction-Line BroadeningApplication of the Smooth Genetic Algorithm for Indexing Powder Patterns ? Tests for the Orthorhombic SystemA Criterion for Correct Indexing of Powder Diffraction Diagrams Based on Preferred Orientation (Texture)Rietveld Refinement Using Debye-Scherrer Film TechniquesIntegration of Intensity and Angle Calibration into Rietveld RefinementAb Initio Calculations of Diffraction Patterns of Submicron PowdersAddition Method in the Quantitative Analysis: Dependence of Error on the Quantity of AdditiveDOP-FIT Method for Quantitative Analysis of Multicomponent PowdersQuantitative X-Ray Phase Analysis of Materials with Disordered StructuresA New Possibility for Powder Diffraction: The Characterization of the Domain Microstructure in a Ferroelectric MaterialX-Ray and Neutron Analysis of the Dislocation Content in Plastically Deformed ?-BrassThe Cross Correlation Method: A Useful Tool for Peak Shift Determination in XSEEmpirical Texture Correction for Different Diffraction Geometrics: Experimental TestsNew Opportunities in the Texture and Stress Field by the Whole Pattern AnalysisAnalysis of Peak Shapes in X-Ray Diffractometry (GUINIER Geometry) of Standard Materials Using Asymmetric Profile FunctionsDiffraction Anomalous Fine Structure Analysis on (Bi,Pb)2PtO4 PowdersRapid Polymer Identification with X-Ray DiffractionAn Improved X-Ray Image Plate Detector for DiffractometryRefinement of Powder Diffraction Data Collected Using Imaging PlatesX-Ray Imaging Using Fluorescence or Polycrystalline DiffractionStress Analysis Using an Area DetectorA Fully Automated High-Temperature Powder DiffractometerA New High-Temperature CameraA Low-Temperature Option Down to -70? C for a High-Temperature AttachmentIn-Situ Time Resolved Synchrotron Powder Diffraction Studies of Syntheses and Chemical ReactionsAssessment of an In-Situ Reactor Cell: Temperature Calibration and Reliability of Diffracted IntensityProfile Smoothing and Differentation with Reciprocal PolynomialsHow to Solve the Problems for the Indexation of Complex Materials Using Laboratory Powder Diffraction: Application to Metal PhosphonatesApplication of the Rietveld Method to XRD Patterns of Thin Films Recorded in Parallel Beam GeometryApplication of a New Rietveld Software for Quantitative Phase Analysis and Lattice Parameter Determination of AIN-SiC-CeramicsAn Interactive Windows Program for Profile Fitting and Size/Strain AnalysisStrain Scanning Using X-Rays and NeutronsResonant Powder X-Ray DiffractionThe Breadth and Shape of Instrumental Line Profiles for the Powder Diffraction Station 2.3 at the Daresbury Laboratory SRSA New White Beam Powder Diffraction Facility at the Daresbury Laboratory Synchrotron Radiation SourceThe High Resolution Powder Diffraction Beam Line at ESRFD2AM: A CRG Beamline at ESRF for Material Science StudiesThrough-Thickness Strain Scanning Using Synchrotron RadiationStructure Refinement with Synchrtron Data: R-Factors, Errors and Significance TestsA Dynamic Study of the Formation of Gas Clathrate Hydrates: In-Situ Synchrotron X-Ray Diffraction and Differential Scanning CalorimetryNeutron Powder Diffractometer at the Budapest Research ReactorROT/DIFF: A Versatile Neutron Powder Time-of-Flight Diffractometer of Wide d-Spacing CoverageNeutron Diffraction Pole-Figure Measurements Using a Pulsed White Beam and the Linear Julios-DetectorEquipment for Residual Stress Measurements with the High Resolution Fourier Diffractometer: Present Status and ProspectsHigh-Resolution Neutron Powder Diffractometry on Samples of Small DimensionsHigh-Tc Superconductor Studies by Means of High-Resolution and High-Intensity Neutron Powder Diffraction at the IBR-2 Pulsed ReactorMagnetic Structures in Cubis Laves PhaseApplications of a Thin Film DiffractometerStructure Parameter Determination of Thin Films by Intensity Fitting in GIABD-GeometryAnalysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray DiffractionThe Crystal Structure and Texture Analyses of Polycrystalline Thin Film Sample Using Multiple Diffraction Datasets Obtained by Asymmetric Diffraction TechniqueAn Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and CoatingsResidual Stress in Ti(C,N) Coatings on HSS SubstrateDynamic Studies from Laboratory X-RaysThe Thermal Decomposition of CeM'2(NO3)6 (M' = K, NH4, Rb) Studied by Temperature-Dependent X-Ray Powder DiffractionX-Ray Characterization of Complex Oxide Catalysts under Preparation and Reaction Conditions: Catalysts for Methanol SynthesisHydrotalcite Thermal Decomposition Mechanism: In Situ Study by XRD, AWAXS and EXAFS of a Layered Catalyst PrecursorTime- and Temperature Resolved X-Ray Powder Diffraction: In Situ Observation of the Ammonolysis Reaction of NH4TaF6Temperature Resolved X-Ray Diffraction of Ammonium Nitrate Evaluated with Rietveld AnalysisDynamic Observation of Crystallographic and Micro Structural Changes Associated with the Collapse and Recrystallisation of Cd Exchanged Zeolite-AThe Dehydration Process in the Natural Zeolite Laumontite: A Real-Time Synchrotron X-Ray Powder Diffraction StudyA Kinetic of the B1-B2 Phase Transition of Rubidium Iodide as a Function of PressureHigh-Pressure Behaviour of Titanium DioxideGIXD (Grazing Incidence X-Ray Diffraction) as a Tool for the In Situ Investigation of Electrochemical Reactions of Metals in Electrolyte Solutions: The Lead Electrode in 5 M Sulphuric AcidMagnetostriction Studied with Precise High Temperature Powder DiffractionHigh Temperature X-Ray Diffraction Studies on the Crystallization of Amorphous Fe-Zr-B AlloysReal Time SAXS/WAXS/DTA Measurements of the Crystalline/Amorphous Transition of Low Molecular Weight Hydrogenated PolybutadieneCrystallization of Gel-Processed PZT PowdersKinetics of the Formation of PLZT: An In-Situ XRD StudyA General Method for the Analysis of Non-Isothermal Kinetic DataEuropean Standardization of XRPD MeasurementsPowder Diffraction Simulation in the CAD of Multicomponenet SystemsThe Effect of Impurities on X-Ray Compton Scattering in BeliteStudy of the Growth of Thin Expitaxial CVD Diamond Films on SiliconResidual Stress in Diamond Coatings by Synchrotron Radiation XRDGrain Size Analysis in Electrodeposited Cu-CoatingsOn the Thickness-Dependence of Textures in Electrodeposited Copper-CoatingsVariation of Preferred Orientation of Erbium Thin Films with Temperature and SubstrateMicrostructure Formation in Electrodeposition of Highly Supersaturated Cu-Pb and Ag-Pb LayersResidual Stress in Plasma-Sprayed Ceramic CoatingsX-Ray Diffraction Microstructural Characterization of PZT (Pb(ZrxTi1-x)O3 and Pt Thin Films on TiN/Ti/BPSG/Si StructuresCharacterization of a New Phase in WO3 Thin Films Grown by Sol-Gel MethodStructure Analysis of Annealed Polycrystalline Ag/NiFe MultilayersX-Ray Reflectivity and Diffuse Scattering Study of Thermally Treated W1-xSix/Si MultilayersCharacterization of Ni/C Multilayers with Fluorescence XAFS Experiments at Fixed Standing Wave Field PositionsX-Ray Diffraction Studies of Silica: Titania Sol-Gel GlassesShallow Angle X-Ray Diffraction from In-Situ Silica: Titania Sol-Gel Thin FilmsX-Ray Powder Diffraction Investigation of the Metastable Phase Sr2Ti5O12 Occurring in Hi-Tech Glass CeramicsEvidence for the Compensated Continuous Random Network Model for Spodumene Glass and AnaloguesStructural Studies of Semiconductor-to-Metal Transition in the Bulk Amorphous Solid Solutions (GaSb)1-x(Ge2)x under High PressureDiffraction Methods for the Characterisation of Defects in Intermetallic CompoundsInvestigation of Structure and Substructure of a Martensitic Stainless SteelInfluence of Laser Treatment on Martensitic Transformation Characteristics in Fe-Ni AlloysInfluence of Multiple Martensitic Transitions on the Crystal Structure of Austenite Single CrystalsIndependent Determination of the Temperature Factor of a Ga Atom in a GaAs Powder SampleImproved X-Ray Powder Diffraction Data for the Disordered ?-Cu6Sn5 Alloy PhaseOnce More about Monoclinic Al13Co4The Magnetic Structures of YMn2Si2 and LaMn2Si2Structural Refinement and Stability of Silicon XIIStructural Determination of (CH3)2SBr2 Using the Swiss-Norwegian Beam Line at ESRFMechanochemical Transformation of Haematite to Magnetite: Structural InvestigationInvestigations on Stability and Long-Term Behaviour of AFm Phases at Higher Temperatures by X-Ray Powder Diffraction MethodsDynamic Studies on the Reactions of Calcium Aluminate Cements with Sulphate Solutions Monitored by Synchrotron Radiation Energy-Dispersive DiffractionThe Structure of Copper Chromite Activated by HydrogenStructural Phase Transitions in KTaO3:Li Crystals: Evidence from X-Ray Powder Diffraction DataX-Ray Studies of Products Formed during Air-Calcination of Contaminated Zinc CarbonatesThe New Intermediate Phase Detected during the In Situ Investigation of Sodium Adipate into LiCl*2Al(OH)3*nH2OPhase Formation in PZN-BT-PT CeramicsPhase Homogeneity in Nd-Doped Lead Titanate CeramicsStudy of Polytype Phase Transition ? to a SiC by Qualitative and Quantitative Analysis of Stacking Disorder by X-Ray Diffraction and Structure ModellingNaA-Zeolites Modified by Me2+-CationsStructure of Metal Hydrides from X-Ray, Synchrotron and Neutron Powder DiffractionStructure Refinements of Alkali FulleridesRietveld Refinement for Selected Pseudobinary SemiconductorsComparative Structure Refinement of MO3.1/3H2O (M = Mo, W) from X-Ray and Neutron Powder Diffraction Data and Dehydration ProcessThe Crystal Structures of Li+ Conducting Phases Li0.5-3x RE0.5+x TiO3: RE=Pr,Nd, x?0.05, from Powder Neutron Diffraction DataStructure Transformation in Diamine-Dichloro-Palladium (II) Studied by X-Ray Powder DiffractionNeutron Diffraction Studies of Me2UX6 Ionic ConductorsRietveld Refinement of Cobalt and Cobalt-Zinc Substituted AIPO-11 AluminophosphatesCopper(II)-Hydroxo-Oxoruthenate(VI): CuRuO2(OH)4 - Ab Initio Structure Determination by X-Ray Powder Diffraction -Barium-Oxomercurato(II)-Oxoruthenate(VI) BaHgRuO5: A New Oxomercurate with a Cyclic Mercurate-Ruthenate Anion High Pressure Synthesis and Ab Initio Structure Approach by X-Ray Powder DiffractionStructural Characterization by Neutron Diffraction of FeRGe2O7, R = La, PrCrystal Structure of LiB5O8?5H2OResolution of the Crystal Structure of the Deficient Perovskite LaNiO2.5 from Neutron Powder Diffraction DataStructural Trends in Pyrochlore OxidesHigh-Resolution X-Ray Powder Diffraction Studies of Some Mg- and Si- Substituted BrownmilleritesRietveld Studies of Leucite AnaloguesHigh Resolution Neutron Diffraction Study of Structural Anomalies in K1-x(ND4)xD2PO4 Mixed CrystalsCharacteristics of the Monoclinic-Tetragonal Transition and the Order-Disorder Transition in Barium HollanditesCrystal Structure Refinement of the Mechanically Activated Spinel-FerriteStructural Analysis of Polycrystalline CaRuO3 and SrRuO3 Ceramics from Room Temperature Up to 1273 KNew Rare Earth Palladates Ln2Pd2O5Rietveld Refinement of the Crystal Structure of Silver-Oxalate from Neutron Powder Diffraction DataQuantification of a Mixture of Synthetic Alite and Belite by the Rietveld MethodStructure and Dynamics of Organic Molecules in a Sodalite Matrix: A Combined Molecular Modeling and RIETVELD Refinement ApproachCrystal Structure Refinement of Ba5Nb4O15 and Ba5Nb4O15-x by Rietveld Analysis of Neutron and X-Ray Diffraction DataCrystal Structure and Morphology of Disordered AINbO4 from X-Ray Powder DiffractionA Combined Powder X-Ray/Neutron Diffraction Study of Cation Distributions in the Ternary Sulphide VCr2S4Microstructure of Magnetite from XRPD Data in Relation to MagnetismResidual Stress of Monoclinic Zircon Obtained by X-Ray Diffraction in ZY4 Oxidized Cladding TubesX-Ray Strain Analysis of Quenched and Ground Alumina SamplesCsMnF4 under Hydrostatic Pressure: Structural Phase Transitions and Influence of the Pressure CalibrantLow Temperature Crystal Structures of Globular Organic MoleculesPowder Diffraction Investigations on Molecular Crystals of the Ring System Cyclo-Tri (2,6-Pyridyl Formamidine)An X-Ray Study of N-(2,3-Dihydroxybenzylidene) 3,4,5-Trimethoxyaniline and its Hydrochloride DerivativeComparison of Powder and Single Crystal Data of C60(C14H10O2), an Oxygen Containing Anthracene Derivative of C60Scattering of X-Rays by Aryl KetonesPoly (Vinyl Butyral) CrystallinityMagnetic Properties of Yb2Cu2O5 by Powder Neutron DiffractionTexture Analysis of the YBCO Thin Films Reveals Twinning in the YBCO CrystallitesBi(2212) Films Prepared by Liquid Phase Epitaxy: Structure Aspects
