GaN Transistor Modeling for RF and Power Electronics

Using The ASM-HEMT Model
Erscheinungsjahr 2024
ISBN: 978-0-323-99871-0
Verlag: William Andrew Publishing

Buch, Englisch, 425 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 1000 g

GaN Transistor Modeling for RF and Power Electronics: Using The ASM-GaN-HEMT Model covers all aspects of characterization and modeling of GaN transistors for both RF and Power electronics applications. Chapters cover an in-depth analysis of the industry standard compact model ASM-HEMT for GaN transistors. The book details the core surface-potential calculations and a variety of real device effects, including trapping, self-heating, field plate effects, and more to replicate realistic device behavior. The authors also include chapters on step-by-step parameter extraction procedures for the ASM-HEMT model and benchmark test results.

GaN is the fastest emerging technology for RF circuits as well as power electronics. This technology is going to grow at an exponential rate over the next decade. This book is envisioned to serve as an excellent reference for the emerging GaN technology, especially for circuit designers, materials science specialists, device engineers and academic researchers and students.

Autoren/Hrsg.

Chauhan, Yogesh Singh

Pampori, Ahtisham Ul Haq

Ahsan, Sheikh Aamir

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Leistungselektronik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Transistoren

Inhaltsverzeichnis

Part I: Introduction
1. GaN Device Physics
2. GaN HEMT Models

Part II: ASM-HEMT Model
3. Surface Potential, 2DEG, and Drain Current Model 
4. Self-Heating and Temperature Effects
5. Noise and Gate Current

Part III: ASM-HEMT for GaN Power Electronics 
6. GaN Power Device Characterization
7. Terminal Charges and Capacitances
8. TCAD Simulation
9. Switching Collapse

Part IV: ASM-HEMT for GaN RF Electronics
10. Characterization of RF GaN HEMTs
11. RF Modeling-I 
12. RF Modeling-II

Part V: Miscellaneous
13. Parameter Extraction
14. Model Quality Testing

Über Autor(innen)

Pampori, Ahtisham Ul Haq
Ahtisham Ul Haq Pampori is a postdoctoral researcher at the Berkeley Device Modeling Center (BDMC), University of California, Berkeley. His research focuses on developing advanced semiconductor device models, particularly next-generation BSIM models for field-effect transistors. He earned his doctorate from the Indian Institute of Technology Kanpur, with a focus on GaN HEMT RF device characterization and modeling. A recipient of the Prime Minister's Research Fellowship, Ahtisham has extensive industry experience collaborating on GaN HEMT characterization and modeling. Prior to academia, he was an Associate Consultant at Frost & Sullivan, specializing in Cloud and Big Data.

Ahsan, Sheikh Aamir
Sheikh Aamir Ahsan possesses expertise in state-of-the-art RF and power GaN SPICE models. Originating from the development of the ASM GaN model during his doctoral studies at IIT Kanpur, presently serving as an Assistant Professor at the National Institute of Technology Srinagar (NITSRI), his team leads the advancement of power GaN technology through modeling and design enablement frameworks. Acting as a consultant for multiple industrial partners, his impact extends beyond academia, as his GaN research seamlessly integrates into commercial SPICE simulators, influencing the trajectory of GaN product development and application globally. He was awarded the Startup Research Grant in 2019 by the Science and Engineering Research Board, India.

Chauhan, Yogesh Singh
Yogesh Singh Chauhan is a Chair Professor in the Department of Electrical Engineering at the Indian Institute of Technology Kanpur, India. He is the developer of several industry standard models: ASM-HEMT, BSIM-BULK (formerly BSIM6), BSIM-CMG, BSIM-IMG, BSIM4 and BSIM-SOI models. His research group is involved in developing compact models for GaN transistors, FinFET, nanosheet/gate-all-around FETs, FDSOI transistors, negative capacitance FETs and 2D FETs. His research interests are RF characterization, modeling, and simulation of semiconductor devices.