Production Planning and Control in Semiconductor Manufacturing

Big Data Analytics and Industry 4.0 Applications
1. Auflage 2023
ISBN: 978-3-031-14064-8
Verlag: Springer International Publishing

Buch, Englisch, 100 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 197 g

Reihe: SpringerBriefs in Applied Sciences and Technology

This book systematically analyzes the applicability of big data analytics and Industry 4.0 from the perspective of semiconductor manufacturing management. It reports in real examples and presents case studies as supporting evidence. In recent years, technologies of big data analytics and Industry 4.0 have been frequently applied to the management of semiconductor manufacturing. However, related research results are mostly scattered in various journal issues or conference proceedings, and there is an urgent need for a systematic integration of these results. In addition, many related discussions have placed too much emphasis on the theoretical framework of information systems rather than on the needs of semiconductor manufacturing management. This book addresses these issues.

Zielgruppe

Research

Autoren/Hrsg.

Chen, Tin-Chih Toly

Fachgebiete

• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik
• Naturwissenschaften Physik Elektromagnetismus Halbleiter- und Supraleiterphysik
• Mathematik | Informatik EDV | Informatik Informatik Mensch-Maschine-Interaktion Ambient Intelligence, RFID, Internet der Dinge
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik
• Mathematik | Informatik EDV | Informatik Angewandte Informatik
• Wirtschaftswissenschaften Betriebswirtschaft Bereichsspezifisches Management Produktionsmanagement, Qualitätskontrolle

Inhaltsverzeichnis

Chapter 1. Big Data Analytics for Semiconductor Manufacturing.- Chapter 2. Industry 4.0 for Semiconductor Manufacturing.- Chapter 3. Cycle Time Prediction and Output Projection.- Chapter 4. Defect Pattern Analysis, Yield Learning Modeling and Yield Prediction.- Chapter 5. Job Sequencing and Scheduling.

Über Autor(innen)

Dr. Toly Chen has been the editor-in-chief of International Journal of Internet Manufacturing and Services. He also guest edited several special issues on 3D printing, ubiquitous manufacturing, and cloud manufacturing. Dr. Chen has published a few papers on semiconductor manufacturing management in journals such as Journal of Intelligent Manufacturing, Robotics and Computer-Integrated Manufacturing, International Journal of Advanced Manufacturing Technology, IEEE Transactions on Semiconductor Manufacturing.