Cressler / Mantooth Extreme Environment Electronics

Erscheinungsjahr 2012
ISBN: 978-1-4398-7431-8
Verlag: Taylor & Francis
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 1050 Seiten

Reihe: Industrial Electronics

Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space.

The Definitive Guide to Extreme Environment Electronics

Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics.

Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material.

With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.

Zielgruppe

Engineers, scientists, and researchers working with extreme environment electronics (integrated circuits and industrial electronics, electronics, aerospace, and solid-state circuits); graduate students in electrical and computer engineering, physics, and materials science; technical managers and technical support or sales personnel in the industry.

Autoren/Hrsg.

Cressler, John D.

Mantooth, H. Alan

Fachgebiete

• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Elektronische Baugruppen, Elektronische Materialien
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise

Inhaltsverzeichnis

Part I Introduction

Big Picture and Some History of the Field
John D. Cressler

Extreme Environments in NASA Planetary Exploration
Elizabeth Kolawa, Mohammad Mojarradi, and Linda Del Castillo

Extreme Environment Electronics in NASA’s Heliophysics Vision
Dana Brewer and Janet Barth

Overview of the NASA ETDP RHESE Program
Andrew S. Keys

Role of Extreme Environment Electronics in NASA’s Aeronautics Research
Gary W. Hunter and Dennis Culley

Technology Options for Extreme Environment Electronics
Jonathan A. Pellish and Lewis M. Cohn

Part II Background

Introduction
John D. Cressler

Physics of Temperature and Temperature’s Role in Carrier Transport
John D. Cressler and Kurt A. Moen

Overview of Radiation Transport Physics and Component Effects
Robert Reed and Janet Barth

Interaction of Radiation with Semiconductor Devices
Ken F. Galloway and Ron D. Schrimpf

Part III Environments and Prediction Tools

Introduction
John D. Cressler

Orbital Radiation Environments
Michael Xapsos

CRÈME96 and Related Error Rate Prediction Methods
James H. Adams, Jr.

Monte Carlo Simulation of Radiation Effects
Robert A. Weller

Extreme Environments in Energy Production and Utilization
Alexander B. Lostetter

Extreme Environments in Transportation
Peter Wilson and H. Alan Mantooth

Part IV Semiconductor Device Technologies for Extreme Environments

Introduction
John D. Cressler

Radiation Effects in Si CMOS Platforms
Lloyd W. Massengill

Wide Temperature Range Operation of Si CMOS Platforms
Aravind C. Appaswamy

Trade-Offs between Performance and Reliability in Sub-100 nm RF-CMOS on SOI Technologies
Rajan Arora

SiGe HBT Platforms
John D. Cressler

Using Temperature to Explore the Scaling Limits of SiGe HBTs
Jiahui Yuan

SiC Integrated Circuit Platforms for High-Temperature Applications
Philip G. Neudeck

Passive Elements in Silicon Technology
Edward P. Wilcox

Power Device Platforms
H. Alan Mantooth

CMOS-Compatible Silicon-on-Insulator MESFETs for Extreme Environments
Trevor J. Thornton, William Lepkowski, Seth J. Wilk, Mohammad Reza Ghajar, Asha Balijepalli, and Joseph Ervin

III-Nitride Platforms
Shyh-Chiang Shen

Photonic Devices
Cheryl J. Marshall

Radiation Hardening by Process
Michael L. Alles

Rad-Hard Silicon Technologies at BAE Systems
Richard W. Berger

Rad-Hard Silicon Technologies at Honeywell
Paul S. Fechner and Jerry Yue

High-Temperature SOI Technologies at Honeywell
Bruce Ohme

Part V Modeling for Extreme Environment Electronic Design

Introduction
H. Alan Mantooth

TCAD of Advanced Transistors
Guofu Niu

Mixed-Mode TCAD Tools
Ashok Raman and Marek Turowski

Mixed-Mode TCAD for Modeling of Single-Event Effects
Kurt A. Moen and Stanley D. Phillips

Compact Modeling of SiGe HBTs
Guofu Niu and Lan Luo

Compact Modeling of CMOS Devices for Extreme Environments
A. Matt Francis

Compact Modeling of LDMOS Transistors
Avinash S. Kashyap

Compact Modeling of Power Devices
Ty R. McNutt

Best Practices for Modeling Radiation Effects in Mixed Signal Circuits
Jeffrey S. Kauppila

Compact Model Toolkits
Jim Holmes and A. Matt Francis

Part VI Device and Circuit Reliability in Extreme Environments

Introduction
John D. Cressler

Failure Mechanisms in Modern Integrated Circuits and Industry Best Practices for Reliability Degradation Predictions
Fernando Guarin

Considerations for the Reliability Estimation of SiGe HBTs
Fernando Guarin

Considerations for the Reliability Estimation of Silicon CMOS
Stewart Rauch

Qualification Methodology for Extreme Environment Electronics
Yuan Chen

Part VII Circuit Design for Extreme Environments

Introduction
H. Alan Mantooth

Best Practices in Radiation Hardening by Design
Jeffrey D. Black

Investigations of RHBD Techniques for SiGe Devices and Circuits
Stanley D. Phillips

Best Practices in Wide Temperature Range Circuit Design
Benjamin J. Blalock

Achieving Invariability in Analog Circuits Operating in Extreme Environments
Peter Wilson, Robert Rudolf, and Reuben Wilcock

Part VIII Examples of Extreme Environment Circuit Designs

Introduction
H. Alan Mantooth

Voltage and Current References
Laleh Najafizadeh

Operational Amplifiers
Benjamin J. Blalock

Cryogenic Low-Noise Amplifiers
Joseph C. Bardin

Active Filters
Fa Foster Dai and Desheng Ma

Analog-to-Digital Converters
Benjamin J. Blalock

Digital-to-Analog Converters
Fa Foster Dai, Yuan Yao, and Zhenqi Chen

CMOS Phase-Locked Loops
T. Daniel Loveless

Low-Voltage, Weakly Saturated SiGe HBT Circuits
Sachin Seth

Memory Circuits
Richard W. Berger

Field Programmable Gate Arrays
Melanie Berg

Microprocessors and Microcontrollers
Ken Li and Michael Johnson

Asynchronous Digital Circuits
Jia Di and Scott C. Smith

Characterizing SETs in Oscillator Circuits
Stephen J. Horst

Low-Voltage Power Electronics
Mohammad Mojarradi and Philippe Adell

Medium-Voltage Power Electronics
Marcelo Schupbach

SiC JFET Integrated Circuits for Extreme Environment Electronics
Philip G. Neudeck, Michael J. Krasowski, and N. F. Prokop

Using CMOS-Compatible SOI MESFETs for Power Supply Management
William Lepkowski, Seth J. Wilk, Mohammad Reza Ghajar, Michael Goryll, Keith Hobert, Bertan Bakkaloglu, and Trevor J. Thornton

Part IX Verification of Analog and Mixed-Signal Systems

Introduction
H. Alan Mantooth

Model-Based Verification
Jim Holmes

Event-Driven Mixed-Signal Modeling Techniques for System-in-Package Functional Verification
Chip Webber

Part X Packaging for Extreme Environments

Introduction
John D. Cressler

Electronic Packaging Approaches for Low-Temperature Environments
R. Wayne Johnson

Electronic Packaging Approaches for High-Temperature Environments
R. Wayne Johnson

Failure Analysis of Electronic Packaging
Linda Del Castillo

Silicon Carbide Power Electronics Packaging
Jared Hornberger, Brice McPherson, and Brandon Passmore

Part XI Real-World Extreme Environment Applications

Introduction
H. Alan Mantooth

A SiGe Remote Sensor Interface
Ryan M. Diestelhorst

A SiGe Remote Electronics Unit
Troy D. England

Distributed Motor Controller for Operation in Extreme Environments
Colin McKinney

Radiation-Hard Multichannel Digitizer ASIC for Operation in the Jovian Environment
Shahid Aslam, Akin Akturk, and Gerard Quilligan

Approaches to Commercial Communications Satellite Design
David A. Sunderland

UHF Micro-Transceiver Development Project
William Bill Kuhn and Yogesh Tugnawat

Down-Hole Instrumentation Package for Energy Well Drilling
Randy Normann

Electronics Requirements for Collider Physics Experiments
Alexander A. Grillo

Cryogenic Electronics for High-Energy Physics Experiments
Veljko Radeka, Gianluigi de Geronimo, and Shaorui Li

Radar Systems for Extreme Environments
Tushar Thrivikraman

Part XII Appendices

Appendix A: Properties of Silicon and Germanium
John D. Cressler

Appendix B: Temperature and Energy Scales
John D. Cressler

Appendix C: Planetary Temperature Ranges and Radiation Levels
H. Alan Mantooth

Appendix D: Ionizing Radiation Test Facilities
Paul W. Marshall

Appendix E: Radiation Testing Protocols and Mil-Spec Standards
Ronald Pease

Appendix F: Primer on the Semiconductor Transport Equations and Their Solution
Guofu Niu

Appendix G: Primer on MOSFETs
H. Alan Mantooth

Appendix H: Primer on Si and SiGe Bipolar Transistors
John D. Cressler

Appendix I: Compendium of NASA’s COTS Radiation Test Data
Martha O’Bryan

Appendix J: Compendium of NASA’s COTS Cryogenic Test Data
Richard L. Patterson and Ahmad Hammoud

Index

Über Autor(innen)

John D. Cressler is currently Ken Byers Professor of Electrical and Computer Engineering at Georgia Tech.

H. Alan Mantooth is a Distinguished Professor of Electrical Engineering and the holder of the 21st Century Endowed Chair in Mixed-Signal IC Design and CAD at the University of Arkansas.