Sonstiges, Englisch, 1020 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
Sonstiges, Englisch, 1020 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g
ISBN: 978-3-03859-777-3
Verlag: Trans Tech Publications
Autoren/Hrsg.
Weitere Infos & Material
The Role of Munich in X-Ray Crystallography and the Development of Powder DiffractionIndexing of Powder Diffraction PatternsQuo Vadis Quantitative Powder Diffraction Phase AnalysisAutomated Multicomponent Phase Identification using Fuzzy Sets and Inverted Data Base SearchXRD as a Tool in Phase-Diagram ImagingAmbiguities in the Interpretation of Powder PatternsDetectability of Phases in Protective Magnetite Thin Film SamplesDepth Distribution of Phase Content Reconstruction in Thin Films X-Ray DiffractometryQuantitative Phase Analysis of Textured MaterialsX-Ray Diffraction Line Profiles due to Real PolycrystalsQuality of Unravelling of Experimental Diffraction Patterns with Artificially Varied OverlapPC-Profile Analysis of Peak Clusters in Angle and Energy Dispersive Powder DiffractometryDesummation of Mixed Powder Diffraction LinesA Method for Data Reduction and Optimal Experimental Design in XPDThe Method of Synthesizing the Function of the Diffraction Maximum Shape. The Possibility of Applying it for Structural RefinementA Correction for Truncation of Powder Diffraction Line ProfilesComparison of Single- and Multiple-Peak Methods for the Determination of Crystallite Size and Lattice Strain using Pseudo-Voigt FunctionsX-Ray Powder Diffraction Data Reduction by Integrating the Wilson and the Warren-Averbach TheoriesSimulation of Diffraction Patterns from Small Bimetallic Crystals with Concentration GradientX-Ray Stress AnalysisInfluence of PSI- and OMEGA-Tilting on X-Ray Stress AnalysisNon-Destructive Stress Measurement with Depth ResolutionDetermination of the Misfit and Layer Thickness of Monocrystalline Epitaxial Layers by Means of High-Resolution X-Ray DiffractionPreferred Orientation in Powder DiffractionTexture Analysis of Multi-Phase Materials by Neutron DiffractionExtinction in Texture AnalysisMethod of Scanning of Reciprocal Space of Axial Textures and its Applications to Structural InvestigationsOn the Use of Rietveld Refinements for Structural StudiesThe Two-Step-Method and its Applications in Crystallographic ProblemsSign Determination from Powder Diffraction Data of CuSo4 ? 5H2OFourier Maps Obtained from Powder Diffraction Data - Applications Beyond Pure IllustrationInfluence of Crystallite Size and Microstain on Structure RefinementCrystal Size Dependent Anisotropic Line Broadening in Rietveld X-Ray AnalysisA Theta-Dependent Error Present in Powder Data of Highly Absorbing Materials: A Surface Roughness Effect?Qualitative XRPD Analysis SystemQualitative X-Ray Phase Analysis on the Basis of the Calculated StandardsProgram Package COMPHYS for IBM PCSolution of Nontraditional Problems Based upon PDF-2Database for Qualitative X-Ray Diffraction Phase Analysis of Natural MaterialsGUFI-WYRIET: An Integrated PC Powder Pattern Analysis PackageMRIA - A Program for a Full Profile Analysis of Powder Neutron-Diffraction Time-of-Flight (Direct and Fourier) SpectraNumerical Refinement of Lattie Parameters: Monoclinic CaseThermal Coefficient of Expansion (TCE)-Program for Calculation of TCE's for Single Crystals of all SystemsDatabase for the Structural Problems of High Temperature SuperconductorsPULPLOT - A PC Routine for the Graphic Representation and Superimposition of X-Ray Powder Diffraction PatternsNew Instrumentation in Powder DiffractionA Powder Diffractometer for Large-Sized SpecimensThe Quantitative Powder Diffractometer, QPDImaging the Focus of a Microfocus X-Ray Source with Zone PlatesFluid Cooled Rotating Anode Without Mechanical Feedthrough of the Anode Axis to the VacuumDiffractometer with a Curved PSD for Analysis of Polycrystalline MicrosamplesX-Ray Diffractometric Sensors in Commercial ProductionNew Detectors in X-Ray DiffractionHighly Stable Position-Sensitive Detectors for Powder DiffractometryThe INEL X-Ray Position Sensitive Detector: A Study of D-Spacing Accuracy and Exposure TimeA Two-Dimensional CCD-Based Detector for X-Ray RadiationAnalyser and P.S.D.: Energy Resolution ImprovementPhysical Principles of X-Ray Storage PhosphorsSilicon Pin Photodiodes as Detectors with High Dynamical Range for X-RaysA High Resolution Gas Electroluminescent Detector for X-Ray Structure AnalysisThe Application of a Proportional-Scintillation-Detector in X-Ray DiffractometryAutoradiographic Image Enhancement of Debye-Scherrer PatternsEnergy Dispersive XRPD at High PressureX-Ray Diffractometer for High Pressure and Low TemperaturesFirst Experiments with a Newly Developed High-Pressure/High-Temperature Cell for Neutron Powder DiffractionLow- and High-Temperature Accessories for the D500 Powder DiffractometerA New Attachment for Non-Ambient X-Ray Powder Diffraction Studies in Various AtmospheresA Furnace for X-Ray Powder Diffraction with Synchrotron RadiationPowder Diffraction using Synchrotron RadiationThe Use of Debye Scherrer Geometry for High Resolution Powder DiffractionA New Beauty for Adone: A High Resolution Powder Diffractometer for Synchrotron Radiation ExperimentsDepth Profiling in Thin Films by Grazing Incidence Diffraction using Synchrotron RadiationA New High Resolution Neutron Powder Diffractometer at the Brookhaven High Flux Beam ReactorA New Neutron-Multi-Detector Diffractometer at the Rossendorf-ReactorStatus and Horizons of Time-Resolved Neutron Scattering at the Pulsed Reactor IBR-2Characterization of Epitaxial Thin Films by X-Ray DiffractionGlory and Misery of the Structure Analysis of Thin Polycrystalline FilmsApplied Crystallography in Advanced CeramicsNeutron Powder Diffraction and Oxide SuperconductorsElucidation of Deformation and Recovery Mechanism in Nickel-Base Alloy 600 by X-Ray Rocking Curve MeasurementsX-Ray Determination of the Martensite Structure in Fe-Ni Base Aged AlloysChanging of the Crystalline Structure of Martensite of High-Nickel Steel at Low TemperatureX-Ray Examination of the Ribbon, Prepared by the High Speed Solidification of the Fe-Ni-Co-Ti AlloyX-Ray Diffraction Studies of Secondary Hardening in CrMoV Hot Working Tool SteelsX-Ray Study of Annealing Process of Au3Cu, AuCu and AuCu3 at 270? C in AirXRD Studies on Atomic Ordering of Ni-Cr Based AlloysStructure of Electrodeposited Cu-Cd Alloys After AnnealingIn Situ Study of Ag Electrode in Contact with a Solid Oxide ElectrolyteStructure and Thermal Diffusion in Al/Fe Thin Films and MultilayersOn Character and Nature of Size Changes in the Lattice Parameters of Small Metal ParticlesStructure of Nanocrystalline Soft-Magnetic MaterialsApplication of Grazing Incidence for the Investigation of the High Temperature Corrosion of SteelHigh Temperature Corrosion Kinetics using a Fast X-Ray Diffraction MethodPowder Diffraction Investigation of ? - e and ? - e' Transformations in an Fe-Mn-C AlloyCrystal Structure of Intermediate Phases in Binary B-Metal Alloys Induced by High PressureNeutron- and X-Ray Powder Investigation of the Zintl Phases NaTl and LiAl at Temperatures up to 900KA High-Pressure X-Ray Diffraction Study of UAs0.6Se0.4XRD Characterization of Sputtered Mo and W Thin FilmsTexture and Lattice Strain Determination of Molybdenum Thin Films Deposited by D.C. Magnetron SputteringStress Analysis by X-Ray Diffraction. The Effect of Cementation on the Surface Distribution of Residual Stresses in Alloy SteelsNeutron Diffraction Study of Sintering of Aluminium OxideSolid Way Synthesis of Barium Aluminate. High Temperature X-Rays Diffraction Study of Intermediary CompoundsSolving X-Ray Powder Pattern Problems Dealing With Layer Structures in the Field of Calcium Aluminum Hydroxi SaltsX-Ray and Neutron Powder Investigations of Pure and Yttrium Doped CeO2 at Temperatures up to 1600 KPhase Studies in the System Chromium-Manganese-Titanium Oxide at Different Oxygen Partial PressuresX-Ray Diffraction of CuS2 under High PressureInfluence of Nd-Substitution on the Orthorhombic/Rhombohedral Phase Transition of LaGaO3A Temperature-Resolved X-Ray Powder Diffraction Study of the Decomposition of Three Metal Hydroxide Nitrates M5(OH)8(NO3)2.2L (M=Cd,Zn; L=H2O, NH3)X-Ray Study of Crystallization Kinetics and Phase Transformations of Zinc- and Cadmium Diphosphide FilmsThe High-Temperature Phase of Zeolite Sr-rho Contracts Appreciably Compared with its Low-Temperature FormThe Using of Multiphase Rietveld Refinement in Quantitative AnalysisProcess-Optimization in Large-Scale Production of Mn-Zn-Ferrites using Powder DiffractionRietveld Analysis and Quantitative Analysis of Ettringite Formed by Hydration of Lignite Gasification AshQuantitative X-Ray Diffraction Rietveld Analysis of Low Temperature Coal AshesThe Calcite-Gypsum Conversion in Mortar Joints of Railroad Tunnels - An X-Ray StudyThe Analysis of Urinary Calculi by X-Ray Diffraction and IR-SpectroscopyPowder Profile Refinement of a Commensurately Modulated Aluminate SodalitePhase Transitions of the Aluminate Sodalite CAWCrystal and Magnetic Structure of the Magnetically Modulated Spinels Zn1-xGa2x/3Cr2Se4 Where (X=0.0, 0.1, 0.2, 0.3, 0.5)Spinel Cation Distribution from Powder X-Ray Diffraction. Data Comparison with External-Field 57Fe M?ssbauer Spectroscopy at 4.2 KA Neutron Diffraction Study of some Spinel Compounds Containing Octahedral Ni and Mn at a 1:3 RatioSymmetry of the Ferroelectric Phases of the Pyrochlore Cd2Nb2O7 - A Study using a Very High Resolution Powder Diffractometer at a Synchrotron Radiation SourceProduction and Characterization of Thin Ferroelectric Lead Zirconate Titanate FilmsStructural Data of the Monoclinic High-Temperature G-Form of La2Si2O7 from X-Ray Powder DiffractionX-Ray Powder Diffraction Study of Francolite by the Rietveld MethodAn X-Ray Powder Diffraction Study on Calcium-Lead HydroxyapatitesRietveld Studies of the Aluminium-Iron Substitution in Synthetic GoethitePowder X-Ray Diffraction Study of Topotactic Lithium Exchange in Manganese (III) Arsenate HydrateRefinement of the Crystal Structure of Pb2HP3O10 by Rietveld AnalysisAb Initio Structure Determination of Zr(OH)2(NO3)2.5H2O from X-Ray Powder Diffraction DataCharacterization of the Natural Zeolite Gonnardite. Structure Analysis of Natural and Cation Exchanged Species by the Rietveld MethodLuminescence Properties and X-Ray Diffraction Line Analysis of LaOBr:TbTexture Analysis of Evaporate Polycrystalline ZnxCd1-xS Thin FilmsThe Phase Composition of ZnO Ceramic Filters for the Desulfurization of Coal Gases in Dependence on their Preparation and the p,t ConditionsTemperature Expansion in (La,Sr)(Mn,Co)O3-Cathode Materials for Solid Oxide Fuel CellsCharacterization of Oxygen-Electrode/Electrolyte Interface Reactions in Solid Oxide Fuel Cells by X-Ray Diffraction MeasurementsThermal Behaviour of Molecular Sieves (SAPO-11/AlPO-11 Type) Investigated by Synchrotron Radiation X-Ray Diffraction (SRXD)Hydrogen Loss and Interdiffusion in Amorphous Si/SiC MultlayersObservation of Annealing Effects in Ti/TiN-Diffusion Barriers using High-Temperature X-Ray DiffractionStructure of TiN Thin Film Grains in Dependence on their Crystallographic OrientationHeat-Treated NiO and Changes of Microstructural ParametersX-Ray Determination of Characteristics of Finely Dispersed Supports and Supported CatalystsIndexing of New Superconducting Oxide Powder PatternsStoichiometry and Temperature Dependence of YBa2Cu3Ox Structure ParametersTemperature Dependence of the Lattice Constants of YBa2Cu3O7-xGrowth of YBa2Cu3O7-x Thin Films on R-Plane Sapphire (O112) Using Yttria Stabilized Zirconia (YSZ) Buffer LayersX-Ray Absorption and Reflection in Materials ScienceSome Sample Preparation Methods for Powder Diffraction at Neste OyCharacterization of Gels and Thin Gel Films by X-Ray Diffraction MethodsTransmission Electron Microscopy: An Important Technique for the Determination of the Crystal Structure of Modulated High-Tc Superconductors
