European Powder Diffraction EPDIC 2

Erscheinungsjahr 1993
ISBN: 978-3-03859-792-6
Verlag: Trans Tech Publications

Sonstiges, Englisch, 1012 Seiten, Format (B × H): 125 mm x 142 mm, Gewicht: 200 g

The power of powder diffraction - the diffraction analysis of polycrystalline specimens - is shown again convincingly in these Proceedings of the Second European Powder Diffraction Conference EPDIC 2.

Autoren/Hrsg.

Delhez, R.

Mittemeijer, E.J.

Inhaltsverzeichnis

State-of-the Art Powder Diffraction Applications with Conventional Sealed-Tube X-Ray SourcesA Practice Oriented Way to Produce Diffraction Reference Cards Using Evaporite MineralsQuantitative Phase Analysis by Using Whole Diffraction ProfilesQuantitative Phase Analysis of Si3N4 Ceramics using the Powder Diffraction Standard Data BaseA Method for the Determinantion of Weight Factors for Quantitative Phase Analysis using Dual Phase Starting Powders with Application to a / ? - Silicon NitrideQuantitative Phase Analysis from X-Ray Powder Diffraction Data using two Stage MethodApplication of the Rietveld Method to Phase Analysis of Multilayered SystemsEstimation of the Texture Correction in X-Ray Phase AnalysisQuantitative Phase Analysis of Texturised MaterialsFourier Methods for Separation of Size and Strain BroadeningBackground and Bragg Scattering Component Separation in Powders via the XRD TechniqueRietveld Refinement employing X-Ray Data on CaWO4 from Different Powder Diffraction GeometriesStress Measurements in Textured MaterialsInterpretation of X-Ray Stress MeasurementsX-Ray Analysis of Residual Stresses and Textures in Thin CoatingsOblique-Texture Electron Diffraction in Powder CrystallographyTexture Investigation by Means of Model FunctionsEstimation of the Texture Component Parameters in Cubic MetalsApplication of the ADC Method for ODF Approximation in Cases of Low Crystal and Sample SymmetriesXRD Texture Investigations with the Employment of Location Sensitive Measuring TechniqueNew Opportunities in X-Ray Texture Analysis of two Phase Ti-Aluminides by Application of a Proportional Scintillation Detector and the Component Method to ODF ReproductionTexture Analysis of Thin Films on Single Crystalline SubstratesX-Ray Diffraction Method for Monitoring of Texture Evolution in LayersTexture Determination of PbZr0.53Ti0.47O3 Thin Films by XRD and BKDPThe Ab-Initio Determination of Crystal Structures from their Powder Diffraction Patterns using a Combination of Entropy Maximisation and Likelihood RankingApplication of a Simulated Annealing Approach in Powder Crystal Structure AnalysisDetermination of Molecular Crystal Structures from X-Ray Powder Diffraction DataAb Initio Determination of Molecular Crystal Structures using Powder Diffraction Data from a Laboratory X-Ray SourceApplication of X-Ray Powder Diffraction for the Investigation of Polytype Structures in Metals and AlloysDiffraction from Thin LayersGlancing-Incidence X-Ray Analysis of Thin FilmsIntermediate-Resolution Reciprocal-Space MapperLocally Resolved X-Ray Investigations by Means of X-Ray OpticsA New Apparatus for In-Situ X-Ray DiffractionIn Situ Study of Particle GrowthA High Pressure Study of Metallic Glasses using Energy-Dispersive Powder DiffractionX-Ray Diffractometry at High TemperaturesOn the use of CPS120 Data in Rietveld AnalysisAn Unconventional Pile-up CorrectionPC-Rietveld Plus, A Comprehensive Rietveld Analysis Package for PCKET - A PC Package for Structure and Substructure InvestigationsZDS - A Computer Program for Analysis of X-Ray Powder Diffraction PatternsProgram for Simulation of Diffraction Pattern of Small Particleski7: A Program for the Simulation of Powder PatternsMacDUST - A Powder Diffraction Package Developed for the ADONE High Resolution Diffraction StationLattice-Constants Database for Clay MineralsSmoothing by Digital Filters and a New Peak Search RoutineIf one does not have a Sample Rotating Device.Simultaneous use of Observed and Calculated Standard Patterns in Quantitative XRD Analysis of Minerals by the Multiphase Rietveld Method: Applicaiton to Phase Quantitation of Mineral Sands and Portland CementUse of the CSD Program Package for Structure Determination from Powder DataHigh-Resolution Synchrotron X-Ray Powder Diffraction for Structural CharacterizationThe ESRF Powder Diffraction Beam LineHigh Resolution Powder Diffraction in Siberian Synchrotron Radiation CenterPeak Shape Functions of Powder Diffractometers using Parallel Beam GeometryPhysical Characteristics of a Julios Time-of-Flight Neutron DiffractometerOptimization of Reverse Time of Flight Neutron Scattering DevicesComparative Neutron Powder Diffraction Experiment under Reactor and Spallation Source ConditionsNeutron Diffraction Analysis of Substructures in Polycrystalline MaterialsPhase Transformations in Materials Studied by TOF Neutron Thermo-DiffractometryTexture Analysis of Surface Layers by Neutron DiffractionAnlaysis of Disordered Materials by Neutron and X-Ray DiffractionZeolite Structure Analysis using Powder Diffraction DataThe Methods of Diffraction Analysis of the Structure-Phase Transformations in Magnetic Alloys Fe-Nd-B SystemThe Influence of Laser and Eelctric Heating of High Nickel Steel on the Martensitic Transformation CharacteristicsThe Change of the Parameter a? by Influence of the Several Factors in Austenite Thermal Instability RangeLow Temperature X-Ray Diffractometry of the Shape Memory Fe-Ni Based AlloysCrystal-Field Influence on the Anisotropic Thermal Expansion in ErCu2 and NdCu2Study of Al4U Stability by XRPDA Contribution to the Phase Diagram of the Quasiternary System (SnkPb(1-k)) (S2Se(1-I))XRPD of new Intermediate Phases in Gd-Ga and Nd-Ga SystemsThe Investigation of the Amorphous Y63Co37 Ribbons Crystallization under Laser Treatment by X-Ray DiffractionThe Structure of E93-Type Phases in the Ni-Nb SystemStructural Characterisation of Corrosion Inhibiting Zinc Nickel Electroplate by Rietveld MethodsStructural Data of YbSe and Yb7+?Se8 from X-Ray Powder DiffractionStructure and Stoichiometry of Al76Cu2Co24Structural Investigations of the Intermediate Valence Systems Yb(CuxAl1-x)5 (x=1,0.8,0.6)Neutron Diffraction Reinvestigation of MnCr2S4Crystal Structure of RNiGe2 Phases (R=Ho, Er, Tm, Lu)Broadened X-Ray Diffraction Profile Analysis of Cold-Rolled Commercial Aluminum and Al-Mg AlloysCorrelation between X-Ray Diffraction Line Profile Analysis and Solid State Reactions Induced by Mechanical Alloying of Elemental PowdersAnalysis of Residual Stress States in Friction-Weldings by Means of Neutron DiffractionTexture of Uniaxial Compressed Two-Phase Titanium-AluminidesKinetics of Growing Oxide Layers Studied by Means of X-Ray DiffractionApplication of X-Ray Diffraction to Studies of High Temperature Corrosion of IronX-Ray Study of TiNiSn and ZrNiSn Intermetallics OxidationStudies on Kinetics and Structures of Phase Transformations in Metallic Oxidhydroxidic HydrogelsHigh Resolution Powder Diffraction Studies on Lattice Parameter Anomalies in Aluminate SodalitesThermal Expansion of Mullite between 700?C and 1500?CDetermination of Phase Transformation of Precipitated Iron Oxides in Temperature Range 298-1073 KHigh-Pressure Studies of Corundum Type Oxides using Synchrotron RadiationHysteresis and Phase Coexistence at the SiO2 a/?- Cristobalite Phase Transition and the Pitfalls of PSD CalibrationHigh-Pressure Ferroelastic Phase Transition in Gillespite: New Evidence from Energy-Dispersive DiffractionCompounds and Solid Solutions in the System CuO-BaO-SiO2-GeO2Investigations on the Ternary Systems Fe-Mo-O and Ni-Mo-ORietveld Refinements on Metal Doped GalliumphosphatesBa2ZrO4 and its HydratesX-Ray Measurements of Cement Hydration ProductsPhase Changes of Hydrous Titanium Oxides in Temperature Range 298-1198 KThermic Dehydroxylation of Muscovite-2M1The Determination of the Thallium content in Nonstoichiometric TIxV5S8 (0.33