Encyclopedia of Materials Characterization

Surfaces, Interfaces, Thin Films
Erscheinungsjahr 1992
ISBN: 978-0-7506-9168-0
Verlag: Elsevier Science & Technology

Buch, Englisch, 800 Seiten, Format (B × H): 156 mm x 234 mm

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.

Autoren/Hrsg.

Evans, Charles

Brundle, Richard

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Verbundwerkstoffe
• Interdisziplinäres Wissenschaften Wissenschaften: Allgemeines Enzyklopädien, Nachschlagewerke, Wörterbücher

Inhaltsverzeichnis

Imaging Techniques, Elemental, Chemical, and Structural Analysis in Electron Beam Column Instruments, Structure Determination by Electron/X-Ray Diffraction/Scattering, Electron Emission Spectroscopies, X-Ray Absorption and Emission Spectroscopies, Visible/UV Emission nad Reflection, Vibrational Spectroscopies and NMR, Ion Scattering Techniques, Mass Spectroscopy and Optical Techniques, Neutron and Nuclear Techniques, Physical and Magnetic Properties