Buch, Englisch, Band 1876, 904 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 1177 g
Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings
Buch, Englisch, Band 1876, 904 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 1177 g
Reihe: Lecture Notes in Computer Science
ISBN: 978-3-540-67946-2
Verlag: Springer Berlin Heidelberg
This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Mathematik | Informatik EDV | Informatik Programmierung | Softwareentwicklung Grafikprogrammierung
- Mathematik | Informatik EDV | Informatik Informatik Künstliche Intelligenz Mustererkennung, Biometrik
- Mathematik | Informatik EDV | Informatik Professionelle Anwendung Fotobeabeitung und Bildbearbeitung
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Robotik
- Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
Weitere Infos & Material
Invited Papers.- Pierre Devijver Lecture.- Hybrid and Combined Methods.- Applications.- Document Image Analysis.- Grammar and Language Methods.- Structural Matching.- Graph-Based Methods.- Shape Analysis.- SSPR Poster Session.- Clustering and Density Estimation.- Object Recognition.- General Methodology I.- General Methodology II.- Feature Extraction and Selection.- SPR Poster Session.
