Garrett High Performance Instrumentation and Automation

1. Auflage 2010
ISBN: 978-1-4200-3735-7
Verlag: Taylor & Francis
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 240 Seiten

Improvements in process control, such as defined-accuracy instrumentation structures and computationally intelligent process modeling, enable advanced capabilities such as molecular manufacturing. High Performance Instrumentation and Automation demonstrates how systematizing the design of instrumentation and automation leads to higher performance through more homogeneous systems, which are frequently assisted by rule-based, fuzzy logic, and neural network process descriptions.

Incorporate Advanced Performance Enhancements into Your Automation Enterprise
The book illustrates generic common core process-to-control concurrent engineering linkages applied to a variety of laboratory and industry automation systems. It outlines:

- Product properties translated into realizable process variables

- Axiomatic decoupling of subprocess variables for improved robustness

- Production planner model-driven goal state execution

- In situ sensor and control structures for attenuating process disorder

- Apparatus tolerance design for minimizing process variabilities

- Production planner remodeling based on product features measurement for quality advancement

Coverage also includes multisensor data fusion, high-performance computer I/O design guided by comprehensive error modeling, multiple sensor algorithmic error propagation, robotic axes volumetric accuracy, quantitative video digitization and reconstruction evaluation, and in situ process measurement methods.

High Performance Instrumentation and Automation reflects the experience of engineer and author Patrick Garrett, including his role as co-principal investigator for an Air Force intelligent manufacturing initiative.
You can download Analysis Suite.xls, computer-aided design instrumentation software, available in the book's description on the CRC Press website.

Zielgruppe

Electrical, mechanical, aerospace, chemical, industrial, materials science, and biomedical engineers; industrial designers of computer-based measurement and automation systems; manufacturing, process control, robotics, semiconductor, chemical, and lasers professionals; research scientists; and graduate and advanced undergraduate students in these areas

Autoren/Hrsg.

Garrett, Patrick H.

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Computergestützte Fertigung

Inhaltsverzeichnis

THERMAL, MECHANICAL, QUANTUM, AND ANALYTICAL SENSORS
Introduction
Instrumentation Error Interpretation
Temperature Sensors
Mechanical Sensors
Quantum Sensors
Analytical Sensors
Bibliography
INSTRUMENTATION AMPLIFIERS AND PARAMETER ERRORS
Introduction
Device Temperature Characteristics
Differential Amplifiers
Operational Amplifiers
Instrumentation Amplifiers
Amplifier Parameter Error Evaluation
Bibliography
INSTRUMENTATION FILTERS WITH NOMINAL ERROR
Introduction
Bandlimiting Instrumentation Filters
Active Filter Networks
Filter Error Analysis
Bibliography
SIGNAL ACQUISITION, CONDITIONING, AND PROCESSING
Introduction
Low-Level Signal Acquisition
Signal Quality in Random and Coherent Interference
DC, Sinusoidal, and Harmonic Signal Conditioning
Analog Signal Processing
Bibliography
DATA CONVERSION DEVICES AND ERRORS
Introduction
Analog Multiplexers
Sample-Holds
Digital-to-Analog Converters
Analog-to-Digital Converters
Bibliography
SAMPLED DATA AND RECOVERY WITH INTERSAMPLE ERROR
Introduction
Sampled Data Theory
Aliasing of Signal and Noise
Sampled Data Intersample and Aperture Error
Output Signal Interpolation Functions
Video Sampling and Reconstruction
Bibliography
ADVANCED INSTRUMENTATION SYSTEMS AND ERROR ANALYSIS
Introduction
Integrated Instrumentation Design
Multisensor Error Propagation
Robotic Axes Volumetric Error
Bibliography
Appendix A
AUTOMATION SYSTEMS CONCURRENT ENGINEERING
Introduction
Concurrent Engineering Common Core
Product Property Apparatus Variables
Robust Process Axiomatic Design
Automated Production Ex Situ Planner
Molecular In Situ Subprocess Control
System Variability Tolerance Analysis
Product Features Remodeling for Quality Maturity
Bibliography
MOLECULAR BEAM EPITAXY SEMICONDUCTOR PROCESSING
Introduction
Molecular Beam Epitaxy Concurrent Engineering
MBE Material Property Modeling
Robust Process Design and PID Tuning
MBE In Situ Ellipsometry
Instrumentation and Control Tolerance Analysis
Bibliography
AEROSPACE COMPOSITES RULE-BASED MANUFACTURING
Introduction
Composite Manufacturing Concurrent Engineering
Composite Cure Properties and Apparatus
Computational Qualitative Reasoning
Rule-Based Ex Situ Planner
In Situ Sensor Fusion Cure Control
Temperature Control Tolerance Analysis
Bibliography
FUZZY LOGIC LASER DEPOSITION SUPERCONDUCTOR PRODUCTION
Introduction
Superconductor Processing Concurrent Engineering
Material Property Modeling
Robust Axiomatic Process Decoupling
Observer Remodeled Ex Situ Planner
Spectrometer In Situ Fuzzy Control
Process Data Tolerance Evaluation
Superconductor Raman Quality Analysis
Bibliography
NEURAL NETWORK DIRECTED STEEL ANNEALING
Introduction
Steel Annealing Concurrent Engineering
Recrystallization Annealing Physical Properties
ANNEAL NET Ex Situ Planner
Steel Annealing In Situ Control
Bibliography
X-RAY CONTROLLED VAPOR INFILTRATION CERAMIC DENSIFICATION
Introduction
Ceramic Matrix Composite Concurrent Engineering
Combustor Product Property Modeling
Microwave Densification Ex Situ Planner
X-Ray and Infrared In Situ Control
Bibliography
INDEX