Golio RF and Microwave Circuits, Measurements, and Modeling

Erscheinungsjahr 2010
ISBN: 978-1-4200-0670-4
Verlag: Taylor & Francis
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 772 Seiten

Reihe: The RF and Microwave Handbook, Second Edition

Highlighting the challenges RF and microwave circuit designers face in their day-to-day tasks, RF and Microwave Circuits, Measurements, and Modeling explores RF and microwave circuit designs in terms of performance and critical design specifications. The book discusses transmitters and receivers first in terms of functional circuit block and then examines each block individually. Separate articles consider fundamental amplifier issues, low noise amplifiers, power amplifiers for handset applications and high power, power amplifiers. Additional chapters cover other circuit functions including oscillators, mixers, modulators, phase locked loops, filters and multiplexers. New chapters discuss high-power PAs, bit error rate testing, and nonlinear modeling of heterojunction bipolar transistors, while other chapters feature new and updated material that reflects recent progress in such areas as high-volume testing, transmitters and receivers, and CAD tools. The unique behavior and requirements associated with RF and microwave systems establishes a need for unique and complex models and simulation tools. The required toolset for a microwave circuit designer includes unique device models, both 2D and 3D electromagnetic simulators, as well as frequency domain based small signal and large signal circuit and system simulators. This unique suite of tools requires a design procedure that is also distinctive. This book examines not only the distinct design tools of the microwave circuit designer, but also the design procedures that must be followed to use them effectively.

Zielgruppe

Electrical, electronics, communications, wireless, and networking engineers, researchers, teachers, technologists, and students.

Autoren/Hrsg.

Golio, Mike

Golio, Janet

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik

Inhaltsverzeichnis

Introduction, P. Fay
Overview of Microwave Engineering, M.Golio Microwave Measurements
Linear Measurements, R.E. Ham
Network Analyzer Calibration, J. Staudinger
Phase Calibration and Measurement, K.A. Remley and P.D. Hale
Noise Measurements, A. Riddle
Nonlinear Microwave Measurement and Characterization, J. Stevenson Kenney
Theory of High-Power Load-Pull Characterization for RF and Microwave Transistors, J.F. Sevic
Pulsed Measurements, A.E. Parker, J.G. Rathmell, and J.B. Scott
Microwave On-Wafer Test, J.-P. Lanteri, C. Jones, and J.R. Mahon
High Volume Microwave Test, J.-P. Lanteri, C. Jones, and J.R. Mahon
Large Signal Network Analysis/Waveform Measurements, J.M. Gering Circuits
Receivers, W.L. Seely
Transmitters, W.L. Seely
Low Noise Amplifier Design, J. Kucera and U. Lott
Microwave Mixer Design, A.M. Pavio
Modulation and Demodulation Circuitry, C. Nelson
Power Amplifier Fundamentals, D.A. Teeter and E.T. Spears
Handset Power Amplifier Design, D.A. Teeter and E.T. Spears
Amplifiers, W.L. Seely
High Power Amplifiers, B. Irvine, T. Heckleman and A. Radomski Oscillator Circuits, A. Riddle
Phase Locked Loop Design, R. Newgard
Filters and Multiplexers, R.V. Snyder
RF Switches, R.J. Trew
Monolithic Microwave IC Technology, L.P. Dunleavy
RFIC Design Trade-Offs (Bringing RFICs to the Market), J. Cowles CAD, Simulation and Modeling
System Simulation, J. Staudinger
Numerical Techniques for the Analysis and Design of RF/Microwave Structures, M.M. Tentzeris
Computer Aided Design of Passive Components, D.G. Swanson, Jr.
Nonlinear RF and Microwave Circuit Analysis, M.B. Steer and J.F. Sevic
Computer Aided Design (CAD) of Microwave Circuitry, R. Kielmeyer
Nonlinear Transistor Modeling for Circuit Simulation, W.R. Curtice
Behavioral Modeling of Microwave Power Amplifiers, T.S. Nielsen
Technology CAD, P.A. Blakey
Appendix A: Mathematics, Symbols, and Physical Constants, H.M. Harris
Appendix B: Microwave Engineering Appendix, J.P. Wendler Index