Advances in Imaging and Electron Physics

Erscheinungsjahr 2004
ISBN: 978-0-12-014772-4
Verlag: ACADEMIC PR INC

Buch, Englisch, Band 130, 315 Seiten, Format (B × H): 158 mm x 235 mm, Gewicht: 680 g

Reihe: Advances in Imaging and Electr

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics.

Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately.

The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

Zielgruppe

Researchers, academics, physicists and engineers working in the field of image and electron physics

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Optische Nachrichtentechnik
• Technische Wissenschaften Technik Allgemein Physik, Chemie für Ingenieure
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Angewandte Optik

Inhaltsverzeichnis

Chapter 1 - Statistical Experimental., (Van DYCK et al)Chapter 2 - Transform-Based., (GRIGORYAN/AGAIAN)Chapter 3 - Image Registration (PETROU)

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.