Advances in Imaging and Electron Physics

Erscheinungsjahr 2019
ISBN: 978-0-12-817469-2
Verlag: ACADEMIC PR INC

Buch, Englisch, Band 211, 320 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 599 g

Reihe: Advances in Imaging and Electr

Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Autoren/Hrsg.

Hawkes, Peter W.

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Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Optik
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

1. Simulation of atomically resolved elemental maps with a multislice algorithm for relativistic electrons Stephan Majert and Helmut Kohl 2. Reviewing the revised International System of Units (SI) Joaquín Valdés 3. Electron energy loss spectroscopy in the electron microscope Christian Colliex

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.