Advances in Imaging and Electron Physics

Erscheinungsjahr 2023
ISBN: 978-0-443-19326-2
Verlag: Elsevier Science & Technology

Buch, Englisch, Format (B × H): 151 mm x 229 mm, Gewicht: 590 g

Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

Preface

1. Novel theory of the structure of elementary particles

H. Rose

2. Electron diffractive optics based on the magnetic Aharonov-Bohm effect

Román Castañeda, Pablo Bedoya-Ríos and Giorgio Matteucci

3. Electronic image recording in conventional electron microscopy

K.-H. Herrmann and D. Krahl

4. The phase problem in electron microscopy

D. L. Misell

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.