Hawkes | Quadrupoles in Electron Lens Design | Buch | 978-0-323-98865-0 | sack.de

Buch, Englisch, 232 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 450 g

Hawkes

Quadrupoles in Electron Lens Design

Buch, Englisch, 232 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 450 g

ISBN: 978-0-323-98865-0
Verlag: William Andrew Publishing


Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams.
Hawkes Quadrupoles in Electron Lens Design jetzt bestellen!

Zielgruppe


<p>Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general</p>


Autoren/Hrsg.


Weitere Infos & Material


1. Introduction Peter Hawkes 2. Definitions, notation, and methods of analysis Peter Hawkes 3. Quadrupole potential functions Peter Hawkes 4. Quadrupole systems: Their suitability for specific tasks Peter Hawkes 5. Quadrupole data Peter Hawkes


Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.


Ihre Fragen, Wünsche oder Anmerkungen
Vorname*
Nachname*
Ihre E-Mail-Adresse*
Kundennr.
Ihre Nachricht*
Lediglich mit * gekennzeichnete Felder sind Pflichtfelder.
Wenn Sie die im Kontaktformular eingegebenen Daten durch Klick auf den nachfolgenden Button übersenden, erklären Sie sich damit einverstanden, dass wir Ihr Angaben für die Beantwortung Ihrer Anfrage verwenden. Selbstverständlich werden Ihre Daten vertraulich behandelt und nicht an Dritte weitergegeben. Sie können der Verwendung Ihrer Daten jederzeit widersprechen. Das Datenhandling bei Sack Fachmedien erklären wir Ihnen in unserer Datenschutzerklärung.