Quadrupoles in Electron Lens Design

Erscheinungsjahr 2022
ISBN: 978-0-323-98865-0
Verlag: William Andrew Publishing

Buch, Englisch, 232 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 450 g

Coulomb Interactions in Particle Beams, Volume 223 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods used in all these domains, with this release exploring Coulomb Interactions in Particle Beams.

Zielgruppe

<p>Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general</p>

Autoren/Hrsg.

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Elektronik, Optik
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

1. Introduction Peter Hawkes 2. Definitions, notation, and methods of analysis Peter Hawkes 3. Quadrupole potential functions Peter Hawkes 4. Quadrupole systems: Their suitability for specific tasks Peter Hawkes 5. Quadrupole data Peter Hawkes

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.