Integrated Circuit Quality and Reliability

2. New Auflage 1994
ISBN: 978-0-8247-9283-1
Verlag: Taylor & Francis Inc

Buch, Englisch, 808 Seiten, Format (B × H): 239 mm x 165 mm, Gewicht: 1288 g

Reihe: Electrical and Computer Engineering

Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Autoren/Hrsg.

Hnatek, Eugene R. (Encinitas, California, USA)

Hnatek, Eugene R.

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Produktionstechnik Zuverlässigkeitstechnik

Inhaltsverzeichnis

Overview. Part 1 Introduction to integrated circuit manufacturing processes: front-end IC fabrication operations; back-end fabrication operations; in-line process monitors and test structures. Part 2 Impact of new technologies: circuit design trends; changing fabrication techniques; packaging technology trends; electrical testing of VLSICs and ASICs. Part 3 Contamination and manufacturing errors: contamination; human contamination (people); IC processing contamination; contamination control; computer-based sources of error in design and test circuit design; material issues. Part 4 Causes (sources) of IC failures: fabrication-related causes of defects; packaging and assembly related causes of IC failures; reliability improvement. Part 5 Introduction to screening: screening.

Über Autor(innen)

Hnatek, Eugene R.