Buch, Englisch, 89 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 178 g
Reihe: SpringerBriefs in Electrical and Computer Engineering
Buch, Englisch, 89 Seiten, Format (B × H): 155 mm x 235 mm, Gewicht: 178 g
Reihe: SpringerBriefs in Electrical and Computer Engineering
ISBN: 978-1-4419-9547-6
Verlag: Springer
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Technik Allgemein Konstruktionslehre und -technik
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Bauelemente, Schaltkreise
- Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
- Mathematik | Informatik EDV | Informatik Programmierung | Softwareentwicklung Software Engineering Softwaretests & Prüfsoftware
Weitere Infos & Material
Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.
