Kasirga Thermal Conductivity Measurements in Atomically Thin Materials and Devices

1. Auflage 2020
ISBN: 978-981-15-5348-6
Verlag: Springer Singapore
Format: PDF
Kopierschutz: 1 - PDF Watermark

E-Book, Englisch, 50 Seiten, eBook

Reihe: SpringerBriefs in Applied Sciences and Technology

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.

Zielgruppe

Research

Autoren/Hrsg.

Kasirga, T. Serkan

Inhaltsverzeichnis

Introduction.- Importance of thermal management in modern applications.- Thermal properties of atomically thin materials and devices.- Thermal conductivity measurement methods for nanosheets.- Steady-state measurement methods.- Transient measurement methods.- Use of photothermal effects as a novel thermal conductivity measurement method.- Outlook.

Über Autor(innen)

Dr. Kasirga completed his Ph.D. in December 2013 and right after moved to Bilkent University as an Assistant Prof. Since 2015 he has been serving as associate director of the National Nanotechnology Research Center at Bilkent University. His research interests are in the area of strongly correlated systems and 2D materials.