Buch, Englisch, 252 Seiten, Format (B × H): 170 mm x 240 mm, Gewicht: 454 g
Reihe: De Gruyter STEM
Buch, Englisch, 252 Seiten, Format (B × H): 170 mm x 240 mm, Gewicht: 454 g
Reihe: De Gruyter STEM
ISBN: 978-3-11-099760-6
Verlag: De Gruyter
Materials Science today is the base for all technological and industrial developments. The book provides the understanding of the advanced spectroscopic and microscopic instruments used for material characterization. The main issues addressed are 1) a detailed understanding of the instrument, including working and handling, 2) sample preparation, and 3) data analysis and interpretation. The book is divided in two parts i.e., Part A discusses microscopic instruments, consisting of Optical Microscope, Scanning Electron Microscopy, Atomic Force Microscopy, Field Emission Scanning Electron Microscope and X-Ray Diffraction. Part B is on spectroscopic instruments and covers FTIR Spectrometer, Raman Spectrometer, X-ray Photoelectron Spectroscopy, Ultraviolet Photoelectron Spectroscopy, Fluorescence Spectroscopy, and Nuclear Magnetic Resonance Spectroscopy.
Zielgruppe
Mechanical Engineers, Material Scientists, Analytical Chemists, C
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
PART A MICROSCOPIC CHARACTERIZATION Chapter 1: Optical Microscope - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Imaging Analysis and Interpretation.
Chapter 2: Scanning Electron Microscopy - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Imaging Analysis and Interpretation.
Chapter 3: Atomic Force Microscopy - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Imaging Analysis and Interpretation.
Chapter 4: Scanning Probe Microscopy - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Imaging Analysis and Interpretation.
Chapter 5: X-Ray Diffraction. - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Imaging Analysis and Interpretation.
PART B SPECTROSCOPIC CHARACTERIZATION Chapter 1: FTIR Spectrometer - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Data Analysis and Interpretation.
Chapter 2: Raman Spectrometer - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Data Analysis and Interpretation.
Chapter 3: X-ray Photoelectron Spectroscopy - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Data Analysis and Interpretation.
Chapter 4: Ultraviolet Photoelectron Spectroscopy - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Data Analysis and Interpretation.
Chapter 5: Fluorescence Spectroscopy - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Data Analysis and Interpretation.
Chapter 6: Nuclear Magnetic Resonance Spectroscopy - Introduction
- Instrumental Details
- Working And Handling of Instruments
- Sample Preparation
- Data Analysis and Interpretation.