Buch, Englisch, Band 10, 222 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 359 g
New Trends for Two and Three Dimensional Structures
Buch, Englisch, Band 10, 222 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 359 g
Reihe: Advanced Structured Materials
ISBN: 978-3-642-26754-3
Verlag: Springer
This book shows an update in the field of micro/nano fabrications techniques of two and three dimensional structures as well as ultimate three dimensional characterization methods from the atom range to the micro scale. Several examples are presented showing their direct application in different technological fields such as microfluidics, photonics, biotechnology and aerospace engineering, between others. The effects of the microstructure and topography on the macroscopic properties of the studied materials are discussed, together with a detailed review of 3D imaging techniques.
Zielgruppe
Research
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Technik Allgemein Nanotechnologie
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
- Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Lasertechnologie, Holographie
Weitere Infos & Material
Preface.- Exploring the possibilities of Laser Interference Patterning for the rapid fabrication of periodic arrays on macroscopic areas.- Laser Micromachining.- Patterning and optical properties of materials at the nanoscale.- Ion beam sputtering, a route for fabrication of highly ordered nanopatterns.- Three-dimensional Open Cell Structures:Evaluation and Fabrication by Additive Manufacturing.- X-ray Microtomography: characterisation of structures and defect analysis.- Submicron Tomography using high energy synchrotron radiation.- Nano characterization of structures by Focused Ion Beam (FIB) Tomography.- Atom probe tomography: 3D imaging at the atomic level.