Optical Measurement of Surface Topography

2011
ISBN: 978-3-642-42684-1
Verlag: Springer

Buch, Englisch, 323 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 517 g

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.

Zielgruppe

Research

Autoren/Hrsg.

Leach, Richard

Fachgebiete

• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Naturwissenschaften Physik Thermodynamik Oberflächen- und Grenzflächenphysik, Dünne Schichten
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden

Inhaltsverzeichnis

Introduction to surface texture measurement.- Some common terms and definitions.- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy.- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.-  Coherence scanning interferometry.- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods.

Über Autor(innen)

Professor Richard Leach works at National Physical Laboratory,Teddington, UK, since 1990. He is a visiting Professor of the Wolfson School for Mechanical and Manufacturing Engineering, Loughborough University. His current position is Principal Research Scientist in the Mass & Dimensional Group, Industry & Innovation Division. He is the lead scientist on three DIUS National Measurement System Engineering Measurement Programme projects: areal surface texture and structured surfaces metrology, development of low force transfer artefacts and probes for micro-coordinate measuring machines. He is also lead scientist on projects funded by DIUS Measurement for Innovators (MfI), EPSRC and EU. Professor Leach is the Measurement Service Manager for the Engineering Nanometrology Measurement Service at NPL.