Lee / Li / Ferrari Capacitance Spectroscopy of Semiconductors

Erscheinungsjahr 2018
ISBN: 978-1-351-36844-5
Verlag: Taylor & Francis
Format: EPUB
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)

E-Book, Englisch, 460 Seiten

Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, in academia, national institutions, and industry, subdivided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. In the Physics section, we establish the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. In the Instrumentation section, we review the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. In the Applications section, we detail the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. In the Emerging Techniques section, we present the latest advances of capacitance-based electrical characterization aimed at reaching nanometer-scale resolution.

This book is the first dedicated treatment of the subject of capacitance spectroscopy of semiconductors. This book caters to an audience with a wide background in materials science, electrical engineering, chemistry, and physics in various career stages from advanced undergraduate- and graduate-level students to professional researchers.

Zielgruppe

Advanced undergraduate-, graduate-level students, and researchers in material science, electrical engineering, chemistry, and physics.

Autoren/Hrsg.

Lee, Jian V.

Li, Jian V.

Ferrari, Giorgio

Fachgebiete

• Naturwissenschaften Chemie Analytische Chemie Massenspektrometrie, Spektroskopie, Spektrochemie
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik

Inhaltsverzeichnis

Introduction to Capacitance Spectroscopy

Jian V. Li and Jennifer T. Heath

Admittance Spectroscopy

Thomas Walter

Deep-Level Transient Spectroscopy

Johan Lauwaert and Samira Khelifi

Capacitance-Voltage and Drive-Level-Capacitance Profiling

Jennifer T. Heath

Basic Techniques for Capacitance and Impedance Measurements

Giorgio Ferrari and Marco Carminati

Advanced Instrumentation for High-Resolution Capacitance and Impedance Measurements

Giorgio Ferrari and Marco Carminati

Time-Domain-Based Impedance Detection

Uwe Pliquett

Comparison of Capacitance Spectroscopy for PV Semiconductors

Adam Halverson

Capacitive Techniques for the Characterization of Organic Semiconductors

Dario Natali and Mario Caironi

Capacitance Spectroscopy for MOS Systems

Salvador Duenas and Helena Castan

Capacitance Spectroscopy in Single-Charge Devices

Alessandro Crippa, Marco Tagliaferri, and Enrico Prati

Scanning Capacitance Microscopy

Jian V. Li and Chunsheng Jiang

Probing the Dielectric Constant at the Nanoscale with Scanning Probe Microscopy

Laura Fumagalli and Gabriel Gomila

SPM-Based Capacitance Spectroscopy

Jian V. Li, Giorgio Ferrari, and Chunsheng Jiang

Scanning Microwave Microscopy

Yongtao Cui and Eric Ma

Über Autor(innen)

Jian V. Li obtained his PhD in electrical engineering from the University of Illinois at Urbana-Champaign, USA, in 2005. He specializes in the characterization of semiconductor materials and devices—especially properties concerning defects, carrier recombination, and interfaces—with capacitance spectroscopy and other electrical-optical techniques.

Giorgio Ferrari obtained his PhD in electronics engineering in 2003 from the Politecnico di Milano, Italy. Since 2005, he has been assistant professor of electronics at the Politecnico di Milano. His research concerns the development of novel integrated instrumentation to probe electrical properties of materials, devices, and biosamples at the nanoscale.