Mathematical Challenges in Electron Microscopy

Erscheinungsjahr 2024
ISBN: 978-0-443-29786-1
Verlag: Elsevier Science & Technology

Buch, Englisch, Format (B × H): 152 mm x 229 mm

Mathematical Challenges in Electron Microscopy, Volume 232 of Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on topics, including Charged Particles in Electromagnetic Fields, Language of Aberration Expansions in Charged Particle Optics, Transporting Charged Particle Beams in Static Fields, Transporting Charged Particles in Radiofrequency Fields, Transporting and Separating Ions in Gas-Filled Channels, Static Magnetic Charged Particle Analyzers, Electrostatic Energy Analyzers, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and much more.

Additional chapters cover Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Maschinenbau
• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Signalverarbeitung
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.