Buch, Englisch, 153 Seiten, Format (B × H): 148 mm x 210 mm
Buch, Englisch, 153 Seiten, Format (B × H): 148 mm x 210 mm
ISBN: 978-3-8396-2058-8
Verlag: Fraunhofer Verlag
The growing demand for enhanced product quality and ecological efficiency leads to the increasing necessity for non-destructive testing across the entire production process. Terahertz-based measurement systems have become a popular choice for non-destructive testing applications due to their unique capability to penetrate dielectric materials. This work focuses on mitigating optical challenges arising from the application of tomography in the terahertz domain and enhancing the operational efficiency of the imaging systems.
This thesis introduces key methodologies to counteract optical phenomena appearing in terahertz tomography such as scattering, reflection, and refraction. The primary focus lies in using a priori information to improve the reconstruction formalism and the application of a multi-channel detector array to increase the measurement speed. The work stands as a substantial stride in terahertz tomography, offering practical solutions to optical challenges and presenting innovative setups for enhanced efficiency. It is aimed at professionals in industrial quality control and non-destructive testing, as well as researchers in the field of terahertz tomography.
Autoren/Hrsg.
Fachgebiete
- Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
- Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Zerstörungsfreie Werkstoffprüfung
- Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Signalverarbeitung
- Naturwissenschaften Physik Elektromagnetismus
