Electron Microscopy and Analysis 2003

Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, 3-5 September 2003
1. Auflage 2019
ISBN: 978-0-367-39453-0
Verlag: CRC Press

Buch, Englisch, 279 Seiten, Format (B × H): 155 mm x 231 mm, Gewicht: 658 g

Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.

Zielgruppe

Academic and Professional Practice & Development

Autoren/Hrsg.

McVitie, S.

McComb, D.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Naturwissenschaften Physik Physik Allgemein
• Technische Wissenschaften Verfahrenstechnik | Chemieingenieurwesen | Biotechnologie Verfahrenstechnik, Chemieingenieurwesen

Inhaltsverzeichnis

Plenary Lectures Functional Materials and Biomaterials New Instrumentation Imaging Theory Theory of Microscopy and Spectroscopy Structural Materials Advances in Nanoanalysis Advances in Imaging Sample Preparation and Nanofabrication Surfaces and Interfaces Nanomaterials Author Index Subject Index

Über Autor(innen)

Stephen McVitie, David McComb