Morphological Image Operators

Erscheinungsjahr 2020
ISBN: 978-0-12-821003-1
Verlag: William Andrew Publishing

Buch, Englisch, 520 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 970 g

Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning

Inhaltsverzeichnis

1. First principles

Henk J.A.M. Heijmans

2. Complete lattices

Henk J.A.M. Heijmans

3. Operators on complete lattices

Henk J.A.M. Heijmans

4. Operators which are translation invariant

Henk J.A.M. Heijmans

5. Adjunctions, dilations, and erosions

Henk J.A.M. Heijmans

6. Openings and closings

Henk J.A.M. Heijmans

7. Hit-or-miss topology and semi-continuity

Henk J.A.M. Heijmans

8. Discretization

Henk J.A.M. Heijmans

9. Convexity, distance, and connectivity

Henk J.A.M. Heijmans

10. Lattice representations of functions

Henk J.A.M. Heijmans

11. Morphology for grey-scale images

Henk J.A.M. Heijmans

12. Morphological filters

Henk J.A.M. Heijmans

13. Filtering and iteration

Henk J.A.M. Heijmans

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.