Buch, Englisch, 520 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 970 g
Buch, Englisch, 520 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 970 g
ISBN: 978-0-12-821003-1
Verlag: William Andrew Publishing
Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Zielgruppe
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Fachgebiete
Weitere Infos & Material
1. First principles
Henk J.A.M. Heijmans
2. Complete lattices
Henk J.A.M. Heijmans
3. Operators on complete lattices
Henk J.A.M. Heijmans
4. Operators which are translation invariant
Henk J.A.M. Heijmans
5. Adjunctions, dilations, and erosions
Henk J.A.M. Heijmans
6. Openings and closings
Henk J.A.M. Heijmans
7. Hit-or-miss topology and semi-continuity
Henk J.A.M. Heijmans
8. Discretization
Henk J.A.M. Heijmans
9. Convexity, distance, and connectivity
Henk J.A.M. Heijmans
10. Lattice representations of functions
Henk J.A.M. Heijmans
11. Morphology for grey-scale images
Henk J.A.M. Heijmans
12. Morphological filters
Henk J.A.M. Heijmans
13. Filtering and iteration
Henk J.A.M. Heijmans