Particles and Waves in Electron Optics and Microscopy

Erscheinungsjahr 2016
ISBN: 978-0-12-804814-6
Verlag: William Andrew Publishing

Buch, Englisch, 358 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 730 g

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik
• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik

Inhaltsverzeichnis

1. Complements of Geometrical Light Optics



2. Complements of Wave Optics



3. Particle Theory of Image Formation



4. Electromagnetic Lenses



5. Electron, Particles, or Waves?



6. The Wavefunction of the Paraxial Electrons



7. Fourier Optics



8. Other Interference Experiments



9. Interpretation of the Experimental Results



10. Off-Axis Electron Holography: A Short Introduction



11. Waveoptical Analysis of the Spherical Aberration



12. Epilogue

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.