Buch, Englisch, Band 61, 256 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 417 g
Proceedings of the 2nd International Conference, Physik Zentrum, Bad Honnef, Fed. Rep. of Germany, June 25¿28, 1991
Buch, Englisch, Band 61, 256 Seiten, Paperback, Format (B × H): 155 mm x 235 mm, Gewicht: 417 g
Reihe: Springer Proceedings in Physics
ISBN: 978-3-642-77146-0
Verlag: Springer
Owing to the increased availability of synchrotron sources,
surface X-ray scattering is a rapidly expanding technique
with important applications to surface structures and
surface phase transitions, roughening of surfaces and
interfaces, and the structure of liquid surfaces, including
polymers, liquid crystals, and organic films. Surface
studies with neutrons, on the other hand provide important
information on liquid andmagnetic films. The contributions
to this volume, written by active researchers in the field,
provide an up-to-date overview of the highly sophisticated
techniques and their applications.
Zielgruppe
Research
Autoren/Hrsg.
Weitere Infos & Material
Conference Summary.- I Surface Crystallography and Phase Transitions.- Surface X-Ray Crystallography and STM Images.- Determination of Metal Adsorbed Surfaces by X-Ray Diffraction.- Au Adsorption on Si(111) Studied by Grazing Incidence X-Ray Diffraction.- Grazing Incidence X-Ray Scattering Study of Staircases of Steps on Si(001) Surfaces.- Structure and Phase Transitions of Ge(111) and Si(111) Surfaces at High Temperatures.- Anomalous Scattering Applied to Co/Si(111) Interface Structure.- X-Ray Reflectivity Studies of Au Surfaces.- Crystal Truncation Rod as a Convolution of Three-Dimensional Bravais Lattice with X-Ray Reflectivity.- Extended X-Ray Reflectivity Analysis of Si(111)7×7.- Critical Phenomena at Surfaces and Interfaces.- Surface-Induced Order Observed on a Cu3Au(001) Surface.- Thermal Dynamics of (110) fcc Metal Surfaces.- Facet Coexistence in the Roughening Transition of Ag(110).- Kinetics of Ordering with Random Impurities: Pb on Ni(001).- II Reflectivity.- Anomalous Reflectivity: A New Method for Determining Density Profiles of Thin Films.- Specular and Diffuse Scattering Studies of Multilayer Interfaces.- Scattering Cross-Section of X-Rays and Neutrons for Grazing Incidence onto Thin Films.- Total Neutron Reflection: Experiments and Analysis.- Profile Refinement in Neutron Reflectivity and Grazing Angle Diffraction.- III Surface X-Ray Standing Waves.- X-Ray Standing Wave Studies of the Liquid/Solid Interface and Ultrathin Organic Films.- Glancing-Incidence X-Ray Analysis of Layered Materials.- Investigation of the Heavy-Atom Distribution in a Langmuir-Blodgett Film by an X-Ray Total External Reflection and Fluorescence Study.- A Structural Investigation of an Ultra-Thin Langmuir-Blodgett Film by an X-Ray Standing Wave Excited in a LSM Substrate Under theBragg Diffraction Condition.- IV Liquid Surfaces.- The Structure of Self-Assembled Monolayers.- Behenic Acid as a Structural Model for Fatty Acid Monolayers at the Air/Water Interface: An X-Ray Diffraction Study.- X-Ray Scattering Studies of Organic Monolayers on Electrolytic Solutions: Arachidic Acid on CdCl2.- The Phases of Phosphatidyl Ethanolamine Monolayers.- X-Ray Diffraction Studies of Fatty Acid Monolayers on the Surface of Water.- Protein Recognition Processes at Functionalized Lipid Surfaces: A Neutron Reflectivity Study.- Neutron Reflection from Liquid/Liquid Interfaces.- Polymer Interfaces Analysed on a Nanometer Scale: X-Ray and Neutron Reflectometry.- Neutron Reflection from Polymers Adsorbed at the Solid/Liquid Interface.- V Electrochemistry.- Electrochemical Roughening of Au(110) Single Crystal Electrodes.- VI Thin Films and Multilayers.- Reflectivity Studies of Thin Au Films and Au Bicrystals with Grain Boundaries.- Depth Resolved Diffuse Scattering from Buried CoSi2 Layers in Silicon.- Glancing Angle X-Ray Techniques for the Analysis of Ion Beam Modified Surfaces.- Surface Analysis of Borkron Glass for Neutron Applications.- X-Ray Bragg Reflectivity of ErAs Epitaxial Films.- Measurement of Magnetic Field Penetration Depth in Niobium Polycrystalline Films by the Polarized Neutron Reflection Method.- Neutron Reflectivity Studies on Superconducting, Magnetic and Absorbing Thin Films on the Polarized Neutron Spectrometer at the Pulsed Reactor IBR-2.- Magnetic Properties of Ultrathin Co/Ag Films Investigated by Polarised Neutron Reflection.- Depth Selective Real Structure Analysis of Semiconductor Superlattices Using Grazing Incidence X-Ray Diffraction.- Investigation of Interfaces with Grazing Incidence Neutron Radiation.- Roughness Characterization of the Surface and Interface of MBE-Grown Thin Films.- VII Instrumentation and Methods.- Neutron Diffraction Under Grazing Incidence: Recent Results from the Evanescent Wave Diffractometer.- Analytical Calculation of the Resolution Correction Function for X-Ray Surface Structure Analysis at High Exit Angles.- Neutron Double Crystal Diffractometry — A Precise Method for Surface Investigations.- Index of Contributors.
