Linear and Chiral Dichroism in the Electron Microscope

1. Auflage 2012
ISBN: 978-981-4267-48-9
Verlag: Taylor & Francis Ltd (Sales)

Buch, Englisch, 278 Seiten, Format (B × H): 155 mm x 231 mm, Gewicht: 567 g

This book describes energy loss magnetic chiral dichroism (EMCD), a phenomenon in energy loss spectroscopy discovered in 2006. EMCD is the equivalent of XMCD but is based on fast probe electrons in the electron microscope. A spatial resolution of 2 nm has been demonstrated, and the lattice-resolved mapping of atomic spins appears feasible. EMCD is, thus, a promising technique for magnetic studies on the nanometer and sub-nanometer scale, providing the technical and logistic advantages of electron microscopy, such as in situ chemical and structural information, easy access, and low cost.

Zielgruppe

Academic and Postgraduate

Autoren/Hrsg.

Schattschneider, Peter

Fachgebiete

• Technische Wissenschaften Technik Allgemein Nanotechnologie
• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Naturwissenschaften Physik Elektromagnetismus Magnetismus
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

Basic Concepts: Momentum Resolved ELNES. Relativistic Effects and the Magic Angle. An Introduction to XMCD. Chirality in EELS and the Role of the Angular Momentum. Calculation Methods: Multiplet Methods. DFT Methods. Multiple-Scattering Theory of Circular Dichroism. Experimental Chiral/Circular Dichroism: EMCD Techniques and Geometries. Data Treatment, Artefacts, Noise. The Role of the Crystal. Sum Rules in EMCD and XMCD. Related Techniques and Perspectives: Magnetic Dichroism in X-Ray Holography. Prospects for Spin Mapping with Atomic Resolution.

Über Autor(innen)

Peter Schattschneider studied physics at the Vienna University of Technology, Austria, and finished in 1973 with a diploma thesis on diffusion profiles in thin films. In 1974, he enrolled in the study of college teacher for physics and mathematics at the University of Vienna and obtained a mag. rer. nat. degree in 1977. After his PhD thesis on X-ray diffraction of binary alloys, he left Vienna University of Technology in 1976 and came back in 1980 as assistant at the Institute for Applied and Technical Physics. In the meantime, he worked in an engineering enterprise, dealing with remote sensing (air- and spaceborne sensors). In 1981, he obtained the Theodor-Körner award for work on the EEL spectrometer installed at the old ELMISKOP IA. In 1988, he became assistant professor at the Institute for Applied and Technical Physics of the Vienna University of Technology, where his main research interests were electron microscopy, inelastic electron–matter interactions, and electron energy-loss spectrometry. In 1992 and 1993, he was employed by the CNRS (Centre Nationale de la Recherche Scientifique) in Paris. Since 1995, he has been professeur invité at the École Centrale Paris. From January 2000 to June 2006, he was head of the University Service Center for Transmission Electron Microscopy (USTEM).