Frontiers in Optical Methods

Nano-Characterization and Coherent Control
Softcover Nachdruck of the original 1. Auflage 2014
ISBN: 978-3-662-50731-5
Verlag: Springer

Buch, Englisch, Band 180, 228 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 3693 g

Reihe: Springer Series in Optical Sciences

This collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan.

Zielgruppe

Research

Autoren/Hrsg.

Shudo, Ken-Ichi

Ohno, Shin-Ya

Katayama, Ikufumui

Fachgebiete

• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

State-of-Art of Terahertz Science and Technology.- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films.- Single Photon Counting and Passive Microscopy of Terahertz Radiation.- Coherent Phonons in Carbon Nanotubes.- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation.- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures.- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy.- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring.- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique.- Terahertz Light Source Based on Synchrotron Radiation.- Terahertz Synchrotron Radiation; Optics and Application.- Far-infrared Spectroscopy on Solids under Ultra High Pressures.- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy.