X-Ray Structure Analysis

1. Auflage 2021
ISBN: 978-3-11-061070-3
Verlag: De Gruyter

Buch, Englisch, 240 Seiten, Format (B × H): 170 mm x 240 mm, Gewicht: 418 g

Reihe: De Gruyter Textbook

This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed.

Zielgruppe

Students and graduates in physics, chemistry and materials scienc

Autoren/Hrsg.

Siegrist, Theo

Fachgebiete

• Naturwissenschaften Physik Thermodynamik Festkörperphysik, Kondensierte Materie
• Naturwissenschaften Chemie Physikalische Chemie Chemische Kristallographie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden

Über Autor(innen)

This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discussed. The book also introduces applications of group theory and tensor properties of crystals. This is the ideal primer for students and graduates to understand the essentials of cristallography.