An Introduction to Surface Analysis by XPS and AES

1. Auflage 2003
ISBN: 978-0-470-84713-8
Verlag: Wiley-Blackwell

Buch, Englisch, 226 Seiten, Format (B × H): 155 mm x 229 mm, Gewicht: 399 g

Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.

Autoren/Hrsg.

Watts, John F.

Wolstenholme, John

Fachgebiete

• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Materialwissenschaft: Verbundwerkstoffe
• Technische Wissenschaften Technik Allgemein Technik: Allgemeines
• Naturwissenschaften Chemie Analytische Chemie Massenspektrometrie, Spektroskopie, Spektrochemie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden

Inhaltsverzeichnis

Preface.

Acknowledgements.

Electron Spectroscopy: Some Basic Concepts.

Electron Spectrometer Design.

The Electron Spectrum: Qualitative and Quantitative Interpretation.

Compositional Depth Profiling.

Applications of Electron Spectroscopy in Materials Science.

Comparison of XPS and AES with Other Analytical Techniques.

Glossary.

Bibliography.

Über Autor(innen)

John F Watts is Professor of Adhesion Science in the School of Engineering at the Unversity Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis.

John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.