E-Book, Englisch, 344 Seiten
Zhang / Li / Kumar Materials Characterization Techniques
1. Auflage 2008
ISBN: 978-1-4200-4295-5
Verlag: Taylor & Francis
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
E-Book, Englisch, 344 Seiten
ISBN: 978-1-4200-4295-5
Verlag: Taylor & Francis
Format: PDF
Kopierschutz: Adobe DRM (»Systemvoraussetzungen)
Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today—whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material’s structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use.
Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement.
This useful volume:
- Explores scientific processes to characterize materials using modern technologies
- Provides analysis of materials’ performance under specific use conditions
- Focuses on the interrelationships and interdependence between processing, structure, properties, and performance
- Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials
- Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography
- Presents the fundamentals of vacuum, as well as X-ray diffraction principles
Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern technologies used to characterize engineering materials, helping readers grasp micro- and nanoscale properties. This text will serve as a valuable guide for scientists and engineers involved in characterization and also as a powerful introduction to the field for advanced undergraduate and graduate students.
Zielgruppe
Materials researchers and students.
Autoren/Hrsg.
Fachgebiete
Weitere Infos & Material
Preface
Introduction
Contact Angle in Surface Analysis
Measuring Contact Angle
Determining Surface Energy of a Homogeneous Solid Surface
Work Examples
X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Atomic Model and Electron Configuration
Principles of XPS and AES
Instrumentation
Routine Limits of XPS
XPS Applications and Case Studies
AES Applications
Scanning Tunneling Microscopy and Atomic Force Microscopy
Working Principle
Instrumentation
Modes of Operation
Differences between STM and AFM
Applications
X-ray Diffraction
X-ray Characteristics and Generation
Lattice Planes and Bragg’s Law
Powder Diffraction
Thin Film Diffraction
Texture Measurement
Grazing Angle X-ray Diffraction
Transmission Electron Microscopy
Basics of Transmission Electron Microscopes
Reciprocal Lattice
Specimen Preparation
Bright-Field and Dark-Field Images
Electron Energy Loss Spectroscopy
Scanning Electron Microscopy
Introduction to Scanning Electron Microscopes
Electron Beam–Specimen Interaction
SEM Operating Parameters
Applications
Chromatographic Methods
General Principles of Chromatography
Ion Exchange Chromatography
Gel Permeation Chromatography
Gel Electrophoresis Chromatography
High-Performance Liquid Chromatography
Gas Chromatography
Quantitative Analysis Methods
Infrared Spectroscopy and UV/Vis Spectroscopy
Infrared Radiation Spectroscopy
Ultraviolet/Visible Spectroscopy
Macro and Micro Thermal Analyses
Macro and Micro Differential Scanning Calorimetry
Isothermal Titration Calorimetry
Thermogravimetric Analysis
Laser Confocal Fluorescence Microscopy
Fluorescence and Fluorescent Dyes
Fluorescence Microscopy
Laser Confocal Fluorescence Microscopy
Applications of LCFM
Index
