Advances in Imaging and Electron Physics

Erscheinungsjahr 2011
ISBN: 978-0-12-385861-0
Verlag: William Andrew Publishing

Buch, Englisch, 360 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 630 g

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Hawkes, Peter W.

Fachgebiete

• Naturwissenschaften Physik Angewandte Physik
• Technische Wissenschaften Technik Allgemein Technische Optik, Lasertechnologie
• Technische Wissenschaften Sonstige Technologien | Angewandte Technik Signalverarbeitung, Bildverarbeitung, Scanning
• Mathematik | Informatik EDV | Informatik Informatik Bildsignalverarbeitung
• Naturwissenschaften Physik Elektromagnetismus Quantenoptik, Nichtlineare Optik, Laserphysik
• Technische Wissenschaften Technik Allgemein Physik, Chemie für Ingenieure
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie

Inhaltsverzeichnis

1. 2D Fourier Transforms in Polar CoordinatesNatalie Baddour2. Superluminal, subluminal, and negative velocities in free-space electromagnetic propagationNeil V. Budko3. Chromatic aberration correction - the next step in electron microscopyRowan Leary and Rik Brydson4. Methods for vectorial analysis and imaging in high-resolution laser microscopy Michele Marrocco5. Image Hierarchy in Gaussian Scale SpaceTomoya Sakai1, Masaki Narita, Takuto, Komazaki, Haruhiko Nishiguchi, Atsushi Imiya6. The Theory of the Boundary Diffraction WaveYusuf Ziya Umul7. History and Solution of the Phase Problem in the Theory of Structure Determination of Crystals from X-ray Di_raction MeasurementsEmil Wolf

Über Autor(innen)

Hawkes, Peter W.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.