Advances in Imaging and Electron Physics

Erscheinungsjahr 2012
ISBN: 978-0-12-394298-2
Verlag: William Andrew Publishing

Buch, Englisch, 484 Seiten, Format (B × H): 152 mm x 229 mm, Gewicht: 760 g

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Zielgruppe

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Autoren/Hrsg.

Weitere Mitwirkende

Deen, Jamal

Fachgebiete

• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Naturwissenschaften Physik Elektromagnetismus Mikroskopie, Spektroskopie
• Technische Wissenschaften Maschinenbau | Werkstoffkunde Technische Mechanik | Werkstoffkunde Werkstoffkunde, Materialwissenschaft: Forschungsmethoden
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik

Inhaltsverzeichnis

- Measurement Techniques and Practical Issues

Jamal Deen

- Transmission lines and passive components

Guennadi A. Kouzaev

- Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping

Mohamed Bakr

- Field-effect types of transistors

Benjamin Iniguez

- RF MEMS Switches and Switch Matrices

Mojgan Daneshmand

- Substrate-Integrated Antennas on Silicon

Natalia K. Nikolova