Digital Noise Monitoring of Defect Origin

1. Auflage. Softcover version of original hardcover Auflage 2007
ISBN: 978-1-4419-4410-8
Verlag: Springer US

Buch, Englisch, Band 2, 224 Seiten, Previously published in hardcover, Format (B × H): 155 mm x 235 mm, Gewicht: 365 g

Reihe: Lecture Notes in Electrical Engineering

Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others. The focus of the book is on determining defect origins. The author divides the process into the stages of monitoring the defect origin, identification of the defect and its stages, and control of the defect. The significance of this work is also connected to the possibility of using the noise as a data carrier for creating technologies that detect the initial stage of changes in objects.

Zielgruppe

Professional/practitioner

Autoren/Hrsg.

Aliev, Telman

Fachgebiete

• Technische Wissenschaften Elektronik | Nachrichtentechnik Nachrichten- und Kommunikationstechnik Fernmeldetechnik
• Mathematik | Informatik Mathematik Numerik und Wissenschaftliches Rechnen Computeranwendungen in der Mathematik
• Technische Wissenschaften Elektronik | Nachrichtentechnik Elektronik Mikroprozessoren
• Technische Wissenschaften Energietechnik | Elektrotechnik Elektrotechnik
• Mathematik | Informatik Mathematik Numerik und Wissenschaftliches Rechnen Angewandte Mathematik, Mathematische Modelle

Inhaltsverzeichnis

Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.